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Volumn 21, Issue SUPPL. 2, 2005, Pages
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Fast maximum-likelihood refinement of electron microscopy images
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Author keywords
[No Author keywords available]
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Indexed keywords
ARTICLE;
BAYES THEOREM;
COMPUTER MODEL;
COMPUTER PROGRAM;
DATA ANALYSIS;
ELECTRON MICROSCOPY;
FOURIER TRANSFORMATION;
GENETIC ALGORITHM;
GENETIC DATABASE;
IMAGE PROCESSING;
IMAGE QUALITY;
INFORMATION RETRIEVAL;
INTERNET;
MATHEMATICAL COMPUTING;
MAXIMUM LIKELIHOOD METHOD;
NORMAL DISTRIBUTION;
PRIORITY JOURNAL;
PROBABILITY;
PROCESS OPTIMIZATION;
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EID: 27544478958
PISSN: 13674803
EISSN: 13674811
Source Type: Journal
DOI: 10.1093/bioinformatics/bti1140 Document Type: Article |
Times cited : (57)
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References (7)
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