Morphology and orientation of thin poly(3-hexylthiophene) (P3HT) films on differently silanized silicon oxide

E-Polymers

Volumn , Issue , 2009, Pages

  Scavia, Guido ^a,b,c   Porzio, William ^b,c   Destri, Silvia ^b,c   Schieroni, Alberto Giacometti ^b,c   Bertini, Fabio ^b,c  

^a Area della Ricerca Roma1 sez   (Italy)

^b Istituto Per Lo Studio Delle Macromolecole Milan   (Italy)

^c CNR   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL ATOMIC STRUCTURE; MORPHOLOGY; OXIDE FILMS; SILICON COMPOUNDS; X RAY DIFFRACTION;

ALKYL CHAIN LENGTHS; ANNEALING TEMPERATURES; ATOMIC-FORCE-MICROSCOPY; LAYER MORPHOLOGY; MORPHOLOGY AND STRUCTURES; NEEDLE-LIKE; POLY (3-HEXYLTHIOPHENE); SILANIZED; THIN LAYERS; X-RAY DIFFRACTION TECHNIQUES;

SILICON OXIDES;

EID: 67651028022     PISSN: None     EISSN: 16187229     Source Type: Journal    
DOI: 10.1515/epoly.2009.9.1.753     Document Type: Article

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