Analysis of the electric field induced elemental separation of Ge 2 Sb2 Te5 by transmission electron microscopy

Applied Physics Letters

Volumn 95, Issue 1, 2009, Pages

  Kang, Dongmin ^a   Lee, Dongbok ^a   Kim, Hyun Mi ^a   Nam, Sung Wook ^a   Kwon, Min Ho ^a   Kim, Ki Bum ^a  

^a Seoul National University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ANODE SIDE; CHEMICAL INSTABILITY; COMPOSITIONAL ANALYSIS; THERMODYNAMIC DRIVING FORCES;

ELECTRIC FIELD EFFECTS; ELECTRON MICROSCOPES; GERMANIUM; SEPARATION; TELLURIUM COMPOUNDS; TRANSMISSION ELECTRON MICROSCOPY;

ELECTRIC NETWORK ANALYSIS;

EID: 67650508382     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3168517     Document Type: Article

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