Spectroscopic ellipsometry studies of Mg-doped ZnO thin films prepared by the sol-gel method

Physica Status Solidi (A) Applications and Materials Science

Volumn 206, Issue 7, 2009, Pages 1488-1493

  Yang, Shenghong ^a   Liu, Ying ^a   Zhang, Yueli ^a   Mo, Dang ^a  

^a SUN YAT SEN UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

BAND GAPS; BOWING EFFECT; FILM COMPOSITION; MG CONTENT; MG-DOPED; NONLINEAR BEHAVIOR; OPTICAL BAND GAP ENERGY; SI (100) SUBSTRATE; SOL-GEL METHODS; UV-VISIBLE;

ENERGY GAP; GELATION; GELS; OPTICAL CONSTANTS; OPTICAL PROPERTIES; SOL-GEL PROCESS; SOL-GELS; SOLS; SPECTROSCOPIC ELLIPSOMETRY; SPONTANEOUS EMISSION; THIN FILMS; ZINC; ZINC OXIDE;

FILM PREPARATION;

EID: 67650456817     PISSN: 18626300     EISSN: 18626319     Source Type: Journal    
DOI: 10.1002/pssa.200824481     Document Type: Article

References (31)

1. D. M. Roessler and W. C. Walker, Phys. Rev. Lett. 17, 310 (1966).
2. F. R. Services, Science 276, 895 (1997).
3. I. Takeuchi, W. Wang, K.-S. Chang, M. A. Aronova, T. Venkatesan, R. D. Vispute, and L. A. Bendersky, J. Appl. Phys. 94, 7336 (2003).
4. H. S. Yang et al., Jpn. J. Appl. Phys., Part 1 44, 7296 (2005).
5. S. Choopun, R. D. Vispute, W. Yang, R. P. Sharma, T. Venkatesan, and H. Shen, Appl. Phys. Lett. 80, 1529 (2002).
6. P. Bhattacharya, R. R. Das, and R. S. Katiyar, Appl. Phys. Lett. 83, 2010 (2003).
7. R. Schmidt-Grund, M. Schubert, B. Rheinlander, D. Fritsch, H. Schmidt, E. M. Kaidashev, M. Lorenz, C. M. Herzinger, and M. Grundmann, Thin Solid Films 455/456, 500 (2004).
8. T. Makino, K. Tamura, C. H. Chia, Y. Segawa, M. Kawasa-ki, A. Ohtomo, and H. Koinuma, Appl. Phys. Lett. 81, 2172 (2002).
9. J. H. Kang, Y. R. Park, and K. J. Kim, Solid State Commun. 115, 127 (2000).
10. S. Kumar, V. Gupte, and K. Sreenivas, J. Phys.: Condens. Matter 18, 3343 (2006).
11. X. Zhang, H. Ma, Q. Wang, J. Ma, F. Zong, H. Xiao, F. Ji, and S. Hou, Physica B 364, 157 (2005).
12. W. I. Park, G. C. Yi, and H. M. Jang, Appl. Phys. Lett. 79, 2022 (2001).
13. Y. J. Lin, P. H. Wu, C. L. Tsai, C. J. Liu, Z. R. Lin, H. C. Chang, and C. T. Lee, J. Appl. Phys. 103, 113709 (2008).
14. R. Ghosh and D. Basak, J. Appl. Phys. 101, 023507 (2007).
15. D. Zhao, Y. Liu, D. Shen, Y. Lu et al., J. Appl. Phys. 90, 5561 (2001).
16. A. R. Forouhi and I. Bloomer, Phys. Rev. B 38, 1865 (1988).
17. R. M. A. Azzam and N. M. Bashara, in: Ellipsometry and Polarized Light (North-Holland, Amsterdam, 1977), p. 89.
18. K. Matsumura, A. Ohnishi, M. Sasaki, T. Kakuta, M. Kur-hara, and M. Sakamoto, Jpn. J. Appl. Phys., Part 1 46, 1432 (2007).
19. A. Ohtomo, M. Kawaasaki, T. Koida, K. Masabuchi, H. Koinuma, Y. Sakurai, and Y. Yoshida, Appl. Phys. Lett. 72, 2466 (1998).
20. M. X. Qiu, Z. Z. Ye, H. P. He, Y. Z. Zhang, X. Q. Gu, L. P. Zhu, and B. H. Zhao, Appl. Phys. Lett. 90, 182116 (2007).
21. A. Suryanarayana Reddy, P. Prathap, Y. P. V. Subbaiah, K. T. Ramakrishna Reddy, and J. Yi, Thin Solid Films 516, 7084 (2008).
22. D. A. G. Bruggeman, Ann. Phys. (Leipzig) 24, 636 (1933).
23. G. E. Jellison, Jr., Opt. Mater. 1, 41 (1992).
24. S. Kirkpatrick, C. D. Gelatt, and M. P. Vecchi, Science 220, 671 (1983).
25. J. C. Tauc, Amorphous and Liquid Semiconductors (Plenum Press, New York, 1974), p. 159.
26. T. Minemoto, T. Negami, S. Nishiwaki, H. Takakura, and Y. Hamakawa, Thin Solid Films 372, 173 (2000).
27. R. Schmidt, B. Rheinlander, M. Schubert, D. Spemann, T. Butz, J. Lenzner, E. M. Kaidashev, M. Lorenz, A. Rahm, H. C. Semmelhack, and M. Grundmann, Appl. Phys. Lett. 82, 2260 (2003).
28. R. Schmidt-Grund, A. Carstens, B. Rheinländer, D. Spe-mann et al., J. Appl. Phys. 99, 123701 (2006).
29. B. Amrani, R. Ahmed, and F. El Haj Hassan, Comput. Ma-ter. Sci. 40, 66 (2007).
30. N. B. Chen and C. H. Sui, Mater. Sci. Eng. B 126, 16 (2006).
31. A. Dietrich, K. Schmalzbaur, and H. Hoffmann, Thin Solid Films 122, 19 (1984).