Structural and optical properties of MgxZn1- xO thin films deposited by magnetron sputtering

Physica B: Condensed Matter

Volumn 364, Issue 1-4, 2005, Pages 157-161

  Zhang, Xijian ^a   Ma, Honglei ^a   Wang, Qingpu ^a   Ma, Jin ^a   Zong, Fujian ^a   Xiao, Hongdi ^a   Ji, Feng ^a   Hou, Shanjia ^a  

^a SHANDONG UNIVERSITY   (China)

Author keywords

Magnetron sputtering; Mg content; MgxZn1 xO thin films

Indexed keywords

ATOMIC FORCE MICROSCOPY; ENERGY GAP; MAGNESIUM COMPOUNDS; MAGNETRON SPUTTERING; OPTICAL PROPERTIES; SAPPHIRE; SPECTROSCOPIC ANALYSIS; SUBSTRATES; X RAY DIFFRACTION ANALYSIS; ZINC OXIDE;

MG CONTENT; MGXZN1-XO THIN FILMS; OPTICAL BAND GAPS; TRANSMITTANCE SPECTRA;

THIN FILMS;

EID: 20344394101     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physb.2005.04.005     Document Type: Article

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