UV-VUV spectroscopic ellipsometry of ternary MgxZn 1-xO (0≤x≤0.53) thin films

Thin Solid Films

Volumn 455-456, Issue , 2004, Pages 500-504

  Schmidt Grund, R ^a   Schubert, M ^a   Rheinlander B ^a   Fritsch, D ^a   Schmidt, H ^a   Kaidashev, E M ^a   Lorenz, M ^a   Herzinger, C M ^b   Grundmann, M ^a  

^a UNIVERSITY OF LEIPZIG   (Germany)

^b J A WOOLLAM CO INC   (United States)

Author keywords

Dielectric function; Ellipsometry; MgZnO; Optical properties; Vacuum ultraviolet; Zinc oxide (ZnO); ZnMgO

Indexed keywords

ANISOTROPY; DIELECTRIC MATERIALS; ELLIPSOMETRY; MAGNESIUM COMPOUNDS; OPTICAL PROPERTIES; OPTOELECTRONIC DEVICES; PULSED LASER DEPOSITION; TERNARY SYSTEMS; VACUUM APPLICATIONS; ZINC OXIDE;

DIELECTRIC FUNCTION; MGZNO; VACUUM ULTRAVIOLET; ZNMGO;

THIN FILMS;

EID: 17144451983     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2003.11.249     Document Type: Conference Paper

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