Geometrical characteristics and surface polarity of inclined crystallographic planes of the wurtzite and zincblende structures

Journal of Electronic Materials

Volumn 38, Issue 6, 2009, Pages 756-760

  Masui, Hisashi ^a   Cruz, Samantha C ^a   Nakamura, Shuji ^a   Denbaars, Steven P ^a  

^a University of California   (United States)

Author keywords

Semipolar orientation; Surface polarity; Wurtzite; Zincblende

Indexed keywords

ATOMIC STEP; CATION-POLARITY; CRYSTALLOGRAPHIC PLANE; EXPERIMENTAL OBSERVATION; GEOMETRICAL CHARACTERISTICS; OFF-AXIS; SEMIPOLAR; SEMIPOLAR ORIENTATION; STICK MODEL; SURFACE GEOMETRIES; SURFACE POLARITIES; SURFACE POLARITY; WURTZITE; WURTZITE STRUCTURE; ZINCBLENDE; ZINCBLENDE STRUCTURES;

EPITAXIAL GROWTH; GALLIUM NITRIDE; MOLECULAR BEAM EPITAXY; SEMICONDUCTING GALLIUM; SEMICONDUCTOR GROWTH; ZINC SULFIDE;

SURFACE STRUCTURE;

EID: 67650447969     PISSN: 03615235     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11664-009-0777-4     Document Type: Conference Paper

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