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Volumn 57, Issue 14, 2009, Pages 4288-4295
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Shifting of the morphotropic phase boundary and superior piezoelectric response in Nb-doped Pb(Zr, Ti)O3 epitaxial thin films
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Author keywords
Epitaxial films; MPB; Phase transition; Piezoelectricity; Sol gel process
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Indexed keywords
COMPOSITIONAL RANGE;
EPITAXIAL PZT;
EPITAXIAL THIN FILMS;
EPITAXIALLY GROWN;
EXPERIMENTAL ANALYSIS;
MORPHOTROPIC PHASE BOUNDARIES;
MPB;
NB-DOPED SRTIO;
PB(ZR ,TI)O;
PHENOMENOLOGICAL THEORY;
PIEZOELECTRIC COEFFICIENT;
PIEZOELECTRIC RESPONSE;
RAMAN SPECTRA;
RHOMBOHEDRAL STRUCTURES;
TETRAGONAL STRUCTURE;
ZR/TI RATIO;
CRYSTALLOGRAPHY;
EPITAXIAL GROWTH;
GELATION;
GELS;
LEAD;
LEAD ALLOYS;
MOLECULAR BEAM EPITAXY;
NANOSTRUCTURED MATERIALS;
NIOBIUM;
PHASE TRANSITIONS;
PIEZOELECTRIC TRANSDUCERS;
PIEZOELECTRICITY;
PYROELECTRICITY;
RAMAN SPECTROSCOPY;
SOL-GEL PROCESS;
SOL-GELS;
SOLS;
SUBSTRATES;
ZIRCONIUM;
EPITAXIAL FILMS;
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EID: 67650105446
PISSN: 13596454
EISSN: None
Source Type: Journal
DOI: 10.1016/j.actamat.2009.05.027 Document Type: Article |
Times cited : (41)
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References (36)
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