Single-crystal Nb-doped Pb(Zr,Ti)O3 thin films on Nb-doped SrTiO3 wafers with different orientations

Applied Physics Letters

Volumn 85, Issue 17, 2004, Pages 3818-3820

  Gong, Wen ^a   Li, Jing Feng ^a   Chu, Xiangcheng ^a   Gui, Zhilun ^a   Li, Longtu ^a  

^a TSINGHUA UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

DOPING (ADDITIVES); ELECTRIC CONDUCTIVITY; FABRICATION; NIOBIUM; POLARIZATION; SOL-GELS; STRONTIUM COMPOUNDS; THIN FILMS;

ANNEALING TEMPERATURES; COERCIVE FIELDS; FILM ORIENTATIONS; SRTIO3;

LEAD COMPOUNDS;

EID: 9744238812     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1807965     Document Type: Article

References (15)

1. J. F. Scott and C. A. Araujo, Science 246, 1400 (1989).
2. S. M. Spearing, Acta Mater. 48, 179 (2000).
3. T. Tsuchiya, I. Yamaguchi, T. Manabe, T. Kumagai, and S. Mizuta, Mater. Sci. Semicond. Process. 5, 207 (2002).
4. Y. Wang, C. Ganpule, B. T. Liu, H. Li, K. Mori, B. Hill, M. Wuttig, R. Ramesh, J. Finder, Z. Yu, R. Droopad, and K. Eisenbeiser, Appl. Phys. Lett. 80, 97 (2002).
5. T. Kiguchi, N. Wakiya, K. Shinozaki, and N. Mizutani, Microelectron. Eng. 66, 708 (2003).
6. K. Fujito, N. Wakiya, K. Shinozaki, and N. Mizutani, J. Ceram. Soc. Jpn. 110, 421 (2002).
7. K. S. Hwang, T. Manabe, T. Nagahama, I. Yamaguchi, T. Kumagai, and S. Mizuta, J. Cryst. Growth 237, 464 (2002).
8. T. Oikawa, K. Takahashi, J. Ishida, Y. Ichikawa, T. Ochiai, K. Saito, A. Sawabe, and H. Funakubo, Integr. Ferroelectr. 46, 55 (2002).
9. J. H. Kim and F. F. Lange, J. Mater. Res. 14, 4004 (1999).
10. D. Remiens, E. Cattan, C. Soyer, and T. Haccart, Mater. Sci. Semicond. Process. 5, 123 (2002).
11. I. Haccart, D. Remiens, and E. Callan, Thin Solid Films 423, 235 (2003).
12. S. H. Oh and H. M. Jang, Appl. Phys. Lett. 72, 1457 (1998).
13. W. Gong, J. F. Li, X. C. Chu, Z. L. Gui, and L. T. Li, Acta Mater. 52, 2787 (2004).
14. K. Yao and F. E. H. Tay, IEEE Trans. Ultrason. Ferroelectr. Freq. Control 50, 113 (2003).
15. X. H. Du, J. H. Zheng, U. Belegundu, and K. Uchino, Appl. Phys. Lett. 72, 2421 (1998).