메뉴 건너뛰기




Volumn 44, Issue 16, 2009, Pages 4211-4218

Applications of electron backscatter diffraction to materials science: Status in 2009

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERISATION; ELECTRON BACK SCATTER DIFFRACTION; IN-DEPTH ANALYSIS; MACROTEXTURE; MICRO-TEXTURE; MICROSTRUCTURE CHARACTERISATION; OTHER APPLICATIONS; PHASE IDENTIFICATION; SCANNING ELECTRON MICROSCOPE;

EID: 67650045407     PISSN: 00222461     EISSN: 15734803     Source Type: Journal    
DOI: 10.1007/s10853-009-3570-0     Document Type: Article
Times cited : (51)

References (55)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.