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Volumn 44, Issue 16, 2009, Pages 4211-4218
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Applications of electron backscatter diffraction to materials science: Status in 2009
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Author keywords
[No Author keywords available]
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Indexed keywords
CHARACTERISATION;
ELECTRON BACK SCATTER DIFFRACTION;
IN-DEPTH ANALYSIS;
MACROTEXTURE;
MICRO-TEXTURE;
MICROSTRUCTURE CHARACTERISATION;
OTHER APPLICATIONS;
PHASE IDENTIFICATION;
SCANNING ELECTRON MICROSCOPE;
BACKSCATTERING;
CRYSTALLINE MATERIALS;
MATERIALS TESTING;
PHASE INTERFACES;
SCANNING ELECTRON MICROSCOPY;
ELECTRON DIFFRACTION;
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EID: 67650045407
PISSN: 00222461
EISSN: 15734803
Source Type: Journal
DOI: 10.1007/s10853-009-3570-0 Document Type: Article |
Times cited : (51)
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References (55)
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