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Volumn 26, Issue 5, 2008, Pages 449-455

Analysis of WC grain growth during sintering using electron backscatter diffraction and image analysis

Author keywords

2 boundaries; Carbides; Grain size; Image analysis

Indexed keywords

ELECTRON DIFFRACTION; GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; IMAGE ANALYSIS; SCANNING ELECTRON MICROSCOPY; SINTERING;

EID: 44649122750     PISSN: 02634368     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ijrmhm.2007.10.004     Document Type: Article
Times cited : (49)

References (9)
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  • 2
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    • Kim, C.-S.1    Rohrer, G.S.2
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    • Microstructure evolution in the cemented carbides WC-Co I. Effect of the C/W ratio on the morphology and defects of the WC grains
    • Wang Y., Heusch M., Lay S., and Allibert C.H. Microstructure evolution in the cemented carbides WC-Co I. Effect of the C/W ratio on the morphology and defects of the WC grains. Phys Stat Sol 193 (2002) 271-283
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.