메뉴 건너뛰기




Volumn 44, Issue 4-5, 2008, Pages 468-475

Ion damage during preparation of nanostructures in magnetite by means of focused ion-beam (FIB) milling

Author keywords

Electron backscatter diffraction; FIB milling; Microstructure; Oxides

Indexed keywords

ION BEAMS; IRON ORES; MAGNETITE; OXIDE MINERALS; WATER POLLUTION;

EID: 53749097355     PISSN: 07496036     EISSN: 10963677     Source Type: Journal    
DOI: 10.1016/j.spmi.2007.12.008     Document Type: Article
Times cited : (3)

References (13)
  • 9
    • 53749095960 scopus 로고    scopus 로고
    • Product data, FEI Company, Hillsboro, OR, www.fei.com
    • Product data, FEI Company, Hillsboro, OR, www.fei.com
  • 10
    • 53749088344 scopus 로고    scopus 로고
    • Orientation Imaging Microscopy software version V4.0, user manual, TexSEM Laboratories (TSL), Draper, UT, 2004
    • Orientation Imaging Microscopy software version V4.0, user manual, TexSEM Laboratories (TSL), Draper, UT, 2004


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.