Automatic determination of recrystallization parameters based on EBSD mapping

Materials Characterization

Volumn 59, Issue 6, 2008, Pages 794-800

  Wu, Guilin ^a   Juul Jensen, Dorte ^a  

^a TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

Author keywords

Algorithm; EBSD; Orientation mapping; Recrystallization

Indexed keywords

ALGORITHMS; BACKSCATTERING; COMPUTATIONAL EFFICIENCY; ELECTRON DIFFRACTION; PARAMETER ESTIMATION;

ORIENTATION MAPPING; RECRYSTALLIZATION PARAMETERS;

RECRYSTALLIZATION (METALLURGY);

EID: 41349110847     PISSN: 10445803     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matchar.2007.06.015     Document Type: Article

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