Dielectric constant measurement of zeolite powders by time-domain reflectometry

Microporous and Mesoporous Materials

Volumn 123, Issue 1-3, 2009, Pages 10-14

  Sun, Minwei ^a   Maichen, Wolfgang ^b   Pophale, Ramdas ^c   Liu, Yan ^a   Cai, Rui ^a   Lew, Christopher M ^a   Hunt, Heather ^d   Deem, Michael W ^c   Davis, Mark E ^d   Yan, Yushan ^a  

^a University of California Riverside   (United States)

^b Teradyne Inc Woodland Hills   (United States)

^c RICE UNIVERSITY   (United States)

^d California Institute of Technology   (United States)

Author keywords

Dielectric constant; Powdered sample; Time domain reflectometry; Ultra low k; Zeolite

Indexed keywords

DIELECTRIC CONSTANT; DIELECTRIC CONSTANTS; FRAMEWORK STRUCTURES; FREQUENCY RANGES; HIGH QUALITY; HIGH RELIABILITY; HIGH-K MATERIALS; INSULATOR MATERIALS; MEASUREMENT METHODS; POWDERED MATERIALS; POWDERED SAMPLE; POWDERED SAMPLES; POWER CONSUMPTION; PURE SILICA ZEOLITES; SCREENING PROCESS; TIME-DOMAIN REFLECTOMETRY; TRANSMISSION LINE; ULTRA LOW-K; ULTRA LOW-K MATERIALS; ZEOLITE POWDER;

CERAMIC CAPACITORS; DIELECTRIC WAVEGUIDES; FILM PREPARATION; HAFNIUM COMPOUNDS; INTEGRATED CIRCUITS; OXIDE MINERALS; PERMITTIVITY; QUARTZ; REFLECTION; REFLECTOMETERS; SILICA; SILICATE MINERALS; TIME DOMAIN ANALYSIS; ZEOLITES;

DIELECTRIC MATERIALS;

EID: 67349272629     PISSN: 13871811     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.micromeso.2009.03.013     Document Type: Article

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