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Volumn 83, Issue 10, 2009, Pages 1253-1256
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Highly conductive p-type nanocrystalline silicon films deposited by RF-PECVD using silane and trimethylboron mixtures at high pressure
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Author keywords
Doping; nc Si:H; PECVD; Structural properties; Trimethylboron
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Indexed keywords
AMORPHOUS AND NANOCRYSTALLINE SILICON;
BORON-DOPED;
DARK CONDUCTIVITY;
DEPOSITION CONDITIONS;
DEPOSITION PARAMETERS;
DEPOSITION PRESSURES;
DOPING;
FILM GROWTH MECHANISM;
HIGH CRYSTALLINITY;
HIGH PRESSURE;
LOW SUBSTRATE TEMPERATURE;
NANO-CRYSTALLINE SILICON THIN FILMS;
NANOCRYSTALLINE SILICON FILMS;
NC-SI:H;
P-TYPE;
PECVD;
PLASMA POWER;
RF-PECVD;
STRUCTURAL AND OPTICAL PROPERTIES;
SUBSURFACE LAYER;
TRIMETHYLBORON;
WINDOW LAYER;
AMORPHOUS FILMS;
BORON;
CONDUCTIVE FILMS;
DOPING (ADDITIVES);
FILM GROWTH;
METALLIC FILMS;
METALLIC GLASS;
NANOCRYSTALLINE SILICON;
OPTICAL PROPERTIES;
PLASMA DEPOSITION;
PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION;
SEMICONDUCTING SILICON COMPOUNDS;
SILANES;
SILICON SOLAR CELLS;
SOLAR ENERGY;
AMORPHOUS SILICON;
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EID: 67349209304
PISSN: 0042207X
EISSN: None
Source Type: Journal
DOI: 10.1016/j.vacuum.2009.03.017 Document Type: Article |
Times cited : (31)
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References (24)
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