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Volumn 83, Issue 10, 2009, Pages 1253-1256

Highly conductive p-type nanocrystalline silicon films deposited by RF-PECVD using silane and trimethylboron mixtures at high pressure

Author keywords

Doping; nc Si:H; PECVD; Structural properties; Trimethylboron

Indexed keywords

AMORPHOUS AND NANOCRYSTALLINE SILICON; BORON-DOPED; DARK CONDUCTIVITY; DEPOSITION CONDITIONS; DEPOSITION PARAMETERS; DEPOSITION PRESSURES; DOPING; FILM GROWTH MECHANISM; HIGH CRYSTALLINITY; HIGH PRESSURE; LOW SUBSTRATE TEMPERATURE; NANO-CRYSTALLINE SILICON THIN FILMS; NANOCRYSTALLINE SILICON FILMS; NC-SI:H; P-TYPE; PECVD; PLASMA POWER; RF-PECVD; STRUCTURAL AND OPTICAL PROPERTIES; SUBSURFACE LAYER; TRIMETHYLBORON; WINDOW LAYER;

EID: 67349209304     PISSN: 0042207X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.vacuum.2009.03.017     Document Type: Article
Times cited : (31)

References (24)
  • 12
    • 0004040706 scopus 로고    scopus 로고
    • Reference spectra are supplied by Jobin Yvon software. Origin of the references:. Palik E.D. (Ed), Elsevier
    • Reference spectra are supplied by Jobin Yvon software. Origin of the references:. In: Palik E.D. (Ed). Handbook of optical constants of solids (1998), Elsevier
    • (1998) Handbook of optical constants of solids


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.