메뉴 건너뛰기




Volumn 159-160, Issue C, 2009, Pages 216-218

Light-beam-induced current measurements on copper-nickel co-contaminated Cz-silicon bicrystals

Author keywords

Extended defects; LBIC; Metal impurities; Metal silicide precipitates; Recombination activity; Silicon

Indexed keywords

CRYSTAL IMPURITIES; NICKEL; PRECIPITATES; SILICIDES; SILICON WAFERS; WAFER BONDING;

EID: 67349189467     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mseb.2008.10.046     Document Type: Article
Times cited : (7)

References (25)
  • 20
    • 0018032106 scopus 로고
    • Donolato C. Optik 52 (1978/79) 19-36
    • (1978) Optik , vol.52 , pp. 19-36
    • Donolato, C.1
  • 21
    • 85165807551 scopus 로고    scopus 로고
    • C. Rudolf, P. Saring, L. Stolze, M. Seibt, current issue
    • C. Rudolf, P. Saring, L. Stolze, M. Seibt, current issue.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.