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Volumn 159-160, Issue C, 2009, Pages 216-218
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Light-beam-induced current measurements on copper-nickel co-contaminated Cz-silicon bicrystals
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Author keywords
Extended defects; LBIC; Metal impurities; Metal silicide precipitates; Recombination activity; Silicon
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Indexed keywords
CRYSTAL IMPURITIES;
NICKEL;
PRECIPITATES;
SILICIDES;
SILICON WAFERS;
WAFER BONDING;
COPPER NICKELS;
EXTENDED DEFECT;
INDUCED CURRENT MEASUREMENTS;
LBIC;
LIGHT BEAM INDUCED CURRENTS;
METAL IMPURITIES;
METAL SILICIDE;
METAL SILICIDE PRECIPITATE;
RECOMBINATION ACTIVITY;
SILICIDE PRECIPITATE;
COPPER;
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EID: 67349189467
PISSN: 09215107
EISSN: None
Source Type: Journal
DOI: 10.1016/j.mseb.2008.10.046 Document Type: Article |
Times cited : (7)
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References (25)
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