메뉴 건너뛰기




Volumn 17, Issue 6, 2009, Pages 827-837

A low power JPEG2000 encoder with iterative and fault tolerant error concealment

Author keywords

Design; Fault tolerant; Iterative; JPEG2000; Low power; Multimedia; Process variation; Random dopant fluctuation (RDF); SRAM; Wavelet

Indexed keywords

FAULT TOLERANT; ITERATIVE; JPEG2000; LOW POWER; MULTIMEDIA; PROCESS VARIATION; RANDOM DOPANT FLUCTUATION (RDF); SRAM; WAVELET;

EID: 67349133522     PISSN: 10638210     EISSN: None     Source Type: Journal    
DOI: 10.1109/TVLSI.2009.2016714     Document Type: Article
Times cited : (18)

References (22)
  • 1
    • 0034833288 scopus 로고    scopus 로고
    • Modeling and analysis of manufacturing variations
    • San Diego, CA
    • S. R. Nassif, "Modeling and analysis of manufacturing variations," in Proc. Custom Integr. Circuit Conf., San Diego, CA, 2001, pp. 223-228.
    • (2001) Proc. Custom Integr. Circuit Conf , pp. 223-228
    • Nassif, S.R.1
  • 2
    • 0042635808 scopus 로고    scopus 로고
    • Death, taxes and failing chips
    • Anaheim, CA
    • C. Visweswariah, "Death, taxes and failing chips," in Proc. Des. Autom. Conf., Anaheim, CA, 2003, pp. 343-347.
    • (2003) Proc. Des. Autom. Conf , pp. 343-347
    • Visweswariah, C.1
  • 4
    • 29144526605 scopus 로고    scopus 로고
    • Modeling of failure probability and statistical design of SRAM array for yield enhancement in nanoscaled CMOS
    • Dec
    • S. Mukhopadhyay, H. Mahmoodi, and K. Roy, "Modeling of failure probability and statistical design of SRAM array for yield enhancement in nanoscaled CMOS," IEEE Trans. CAD Integr. Circuits Syst., vol. 24, no. 12, pp. 1859-1880, Dec. 2005.
    • (2005) IEEE Trans. CAD Integr. Circuits Syst , vol.24 , Issue.12 , pp. 1859-1880
    • Mukhopadhyay, S.1    Mahmoodi, H.2    Roy, K.3
  • 6
    • 26444502003 scopus 로고    scopus 로고
    • C. Zhang, Y. Long, and F. Kurdahi, A scalable embedded JPEG2000 architecture, in Embedded Computer Systems: Architecture, Modeling and Simulation, Hamalainen, Ed. et al. New York: Springer, 2005, LNCS 3553, Lecture Notes in Computer Science.
    • C. Zhang, Y. Long, and F. Kurdahi, "A scalable embedded JPEG2000 architecture," in Embedded Computer Systems: Architecture, Modeling and Simulation, Hamalainen, Ed. et al. New York: Springer, 2005, vol. LNCS 3553, Lecture Notes in Computer Science.
  • 7
    • 21844474580 scopus 로고    scopus 로고
    • Novel motion-JPEG2000 video transmission system over CDMA environment
    • Oct
    • Y. Inoue, Y. Kajikawa, and Y. Nomura, "Novel motion-JPEG2000 video transmission system over CDMA environment," in Proc. IEEE Int. Symp. Commun. Inf. Technol., Oct. 2004, vol. 1, pp. 265-268.
    • (2004) Proc. IEEE Int. Symp. Commun. Inf. Technol , vol.1 , pp. 265-268
    • Inoue, Y.1    Kajikawa, Y.2    Nomura, Y.3
  • 8
    • 67349257109 scopus 로고    scopus 로고
    • ITU Recommendation T.800, ISO/IEC International Standard 15444-1, 2000.
    • ITU Recommendation T.800, ISO/IEC International Standard 15444-1, 2000.
  • 11
    • 3042622321 scopus 로고    scopus 로고
    • Defect and error tolerance in the presence of massive numbers of defects
    • May-Jun
    • M. A. Breuer, S. K. Gupta, and T. M. Mak, "Defect and error tolerance in the presence of massive numbers of defects," IEEE Des. Test Comput., vol. 21, no. 3, pp. 216-227, May-Jun. 2004.
    • (2004) IEEE Des. Test Comput , vol.21 , Issue.3 , pp. 216-227
    • Breuer, M.A.1    Gupta, S.K.2    Mak, T.M.3
  • 12
    • 12144290924 scopus 로고    scopus 로고
    • Motion JPEG2000 for high quality video systems
    • Nov
    • S. Fossel, G. Fottinger, and J. Mohr, "Motion JPEG2000 for high quality video systems," IEEE Trans. Consumer Electron., vol. 49, no. 4, pp. 787-791, Nov. 2003.
    • (2003) IEEE Trans. Consumer Electron , vol.49 , Issue.4 , pp. 787-791
    • Fossel, S.1    Fottinger, G.2    Mohr, J.3
  • 13
    • 27744554422 scopus 로고    scopus 로고
    • Salt-and-Pepper noise removal by median-type noise detectors and detail-preserving regularization
    • Oct
    • R. H. Chan, C. W. Ho, and M. Nikolova, "Salt-and-Pepper noise removal by median-type noise detectors and detail-preserving regularization," IEEE Trans. Image Process., vol. 14, no. 10, pp. 1479-1485, Oct. 2005.
    • (2005) IEEE Trans. Image Process , vol.14 , Issue.10 , pp. 1479-1485
    • Chan, R.H.1    Ho, C.W.2    Nikolova, M.3
  • 14
    • 34047214120 scopus 로고    scopus 로고
    • Deblurring of color images corrupted by impulsive noise
    • Apr
    • L. Bar, A. Brook, N. Sochen, and N. Kiryati, "Deblurring of color images corrupted by impulsive noise," IEEE Trans. Image Process., vol. 16, no. 4, pp. 1101-1111, Apr. 2007.
    • (2007) IEEE Trans. Image Process , vol.16 , Issue.4 , pp. 1101-1111
    • Bar, L.1    Brook, A.2    Sochen, N.3    Kiryati, N.4
  • 15
    • 67349217033 scopus 로고    scopus 로고
    • Barco Inc., Louvain la Neuve, Belgium, JPEG2000 Fact Sheet, [Online] . Available: http://www.barco.com/subcontracting/Downloads/IP-Products/ BA112JPEG2000EFactSheet.pdf
    • Barco Inc., Louvain la Neuve, Belgium, "JPEG2000 Fact Sheet," [Online] . Available: http://www.barco.com/subcontracting/Downloads/IP-Products/ BA112JPEG2000EFactSheet.pdf
  • 16
    • 67349143330 scopus 로고    scopus 로고
    • Analog Devices Inc., Norwood, MA, ADV202: JPEG 2000 Video CODEC, [Online]. Available: http://www.analog.com/en/prod/0,ADV202,00.html
    • Analog Devices Inc., Norwood, MA, "ADV202: JPEG 2000 Video CODEC," [Online]. Available: http://www.analog.com/en/prod/0,ADV202,00.html
  • 17
    • 67349185529 scopus 로고    scopus 로고
    • Texas Instruments, Dallas, TX, Semiconductor technology for advanced wireless handsets, [Online]. Available: http://www.cie-dfw.org/ 2006Convention/CIE-2006-microelctronic-Bill-Krenik.pdf
    • Texas Instruments, Dallas, TX, "Semiconductor technology for advanced wireless handsets," [Online]. Available: http://www.cie-dfw.org/ 2006Convention/CIE-2006-microelctronic-Bill-Krenik.pdf
  • 18
    • 3042624706 scopus 로고    scopus 로고
    • SoC yield optimization via an embedded-memory test and repair infrastructure
    • May-Jun
    • S. Shoukourian, V. Vardanian, and Y. Zorian, "SoC yield optimization via an embedded-memory test and repair infrastructure," IEEE Des. Test Comput., vol. 21, no. 3, pp. 200-207, May-Jun. 2004.
    • (2004) IEEE Des. Test Comput , vol.21 , Issue.3 , pp. 200-207
    • Shoukourian, S.1    Vardanian, V.2    Zorian, Y.3
  • 19
    • 34548133522 scopus 로고    scopus 로고
    • Cross layer error exploitation for aggressive voltage scaling
    • A. K. Djahromi, A. M. Eltawil, F. Kurdahi, and R. K. U. Irvine, "Cross layer error exploitation for aggressive voltage scaling," in Proc. ISQED, 2007, pp. 192-197.
    • (2007) Proc. ISQED , pp. 192-197
    • Djahromi, A.K.1    Eltawil, A.M.2    Kurdahi, F.3    Irvine, R.K.U.4
  • 22
    • 67349110994 scopus 로고    scopus 로고
    • HP Labs, Palo Alto, CA, CACTI 4 Overview, [Online]. Available: http://www.hpl.hp.com/personal/Norman-Jouppi/cacti4.html
    • HP Labs, Palo Alto, CA, "CACTI 4 Overview," [Online]. Available: http://www.hpl.hp.com/personal/Norman-Jouppi/cacti4.html


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.