Increasing scan compression by using X-chains

Proceedings - International Test Conference

Volumn , Issue , 2008, Pages

  Wohl, P ^a   Waicukauski, J A ^a   Neuveux, F ^a  

^a SYNOPSYS INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPLEX DESIGNS; DESIGN FOR TEST; FULLY INTEGRATED; INDUSTRIAL DESIGN; SCAN CELLS; SCAN TESTING; TEST GENERATIONS; USER INPUT;

DESIGN; QUALITY ASSURANCE; QUALITY FUNCTION DEPLOYMENT; TOTAL QUALITY MANAGEMENT;

TESTING;

EID: 67249141837     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.2008.4700646     Document Type: Conference Paper

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