Elucidating the conductivity-type transition mechanism of p-type Cu2O films from electrodeposition

Journal of the Electrochemical Society

Volumn 156, Issue 7, 2009, Pages

  Nian, Jun Nan ^a   Tsai, Chien Cheng ^a   Lin, Pao Chung ^a   Teng, Hsisheng ^a  

^a NATIONAL CHENG KUNG UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

CONDUCTING GLASS; CU2O FILMS; DEPOSITION PARAMETERS; ELECTROCHEMICAL IMPEDANCE ANALYSIS; HIGHER-DEGREE; INVERSION LAYER; LATTICE DISORDERS; MOTT-SCHOTTKY; N-TYPE CONDUCTIVITY; NANO-CAVITIES; NARROW BAND GAP; OUT-OF-PLANE ORIENTATION; P-TYPE; PHOTOELECTROCHEMICAL RESPONSE; STRUCTURAL FEATURE; SURFACE STATE; TRANSITION MECHANISM; VISIBLE LIGHT; X RAY ABSORPTION FINE STRUCTURES;

ABSORPTION; ABSORPTION SPECTROSCOPY; CRYSTAL ORIENTATION; ELECTROCHEMICAL IMPEDANCE SPECTROSCOPY; ELECTRODEPOSITION; PHOTOELECTRON SPECTROSCOPY; SODIUM; SPECTROSCOPIC ANALYSIS; ULTRAVIOLET PHOTOELECTRON SPECTROSCOPY; ULTRAVIOLET SPECTROSCOPY; X RAY PHOTOELECTRON SPECTROSCOPY;

CONDUCTIVE FILMS;

EID: 65949124454     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.3125800     Document Type: Article

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