Investigation of copper(I) oxide quantum dots by near-edge X-ray absorption fine structure spectroscopy

Chemistry of Materials

Volumn 15, Issue 20, 2003, Pages 3939-3946

  Nachimuthu, Ponnusamy ^a,b   Thevuthasan, Suntharampillai ^c   Kim, Yong J ^d   Lea, Alan S ^c   Shutthanandan, Vaithiyalingam ^c   Engelhard, Mark H ^c   Baer, Donald R ^c   Chambers, Scott A ^c   Shuh, David K ^b   Lindle, Dennis W ^a   Gullikson, Eric M ^b   Perera, Rupert C C ^b  

^a UNIVERSITY OF NEVADA   (United States)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^c PACIFIC NORTHWEST NATIONAL LABORATORY   (United States)

^d Hanbat National University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

MONOLAYERS; PHOTOCHEMICAL REACTIONS; SEMICONDUCTOR QUANTUM DOTS; SUBSTRATES; X RAY SPECTROSCOPY;

SUBSTRATE SURFACES;

COPPER OXIDES;

COPPER DERIVATIVE; COPPER OXIDE; STRONTIUM; UNCLASSIFIED DRUG;

ARTICLE; MOLECULAR INTERACTION; PHOTOCHEMISTRY; QUANTUM MECHANICS; RADIATION ABSORPTION; SPECTROSCOPY; STRUCTURE ANALYSIS; SURFACE PROPERTY; THICKNESS; VACUUM; X RAY;

EID: 0141864404     PISSN: 08974756     EISSN: None     Source Type: Journal    
DOI: 10.1021/cm021757n     Document Type: Article

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