-
1
-
-
65949102075
-
-
ITRS Roadmap, 2007 edition.
-
ITRS Roadmap, 2007 edition.
-
-
-
-
2
-
-
0000034975
-
-
0003-6951,. 10.1063/1.123974
-
C. -K. Hu, R. Rosenberg, and K. Y. Lee, Appl. Phys. Lett. 0003-6951, 74, 2945 (1999). 10.1063/1.123974
-
(1999)
Appl. Phys. Lett.
, vol.74
, pp. 2945
-
-
Hu, C.-K.1
Rosenberg, R.2
Lee, K.Y.3
-
3
-
-
29744456038
-
-
0021-8979,. 10.1063/1.2140872
-
C. -K. Hu, L. M. Gignac, E. Linger, C. Detavenier, S. G. Malhotra, and A. Simon, J. Appl. Phys. 0021-8979, 98, 124501 (2005). 10.1063/1.2140872
-
(2005)
J. Appl. Phys.
, vol.98
, pp. 124501
-
-
Hu, C.-K.1
Gignac, L.M.2
Linger, E.3
Detavenier, C.4
Malhotra, S.G.5
Simon, A.6
-
4
-
-
3042856274
-
-
0003-6951,. 10.1063/1.1762991
-
C. -K. Hu, L. M. Gignac, R. Rosenberg, B. Herbst, S. Smith, J. Rubino, D. Canaperi, S. T. Chen, S. C. Seo, and D. Restaino, Appl. Phys. Lett. 0003-6951, 84, 4986 (2004). 10.1063/1.1762991
-
(2004)
Appl. Phys. Lett.
, vol.84
, pp. 4986
-
-
Hu, C.-K.1
Gignac, L.M.2
Rosenberg, R.3
Herbst, B.4
Smith, S.5
Rubino, J.6
Canaperi, D.7
Chen, S.T.8
Seo, S.C.9
Restaino, D.10
-
5
-
-
44349097458
-
-
0003-6951,. 10.1063/1.2929388
-
T. L. Tan, C. L. Gan, A. Y. Du, C. K. Cheng, and J. P. Gambino, Appl. Phys. Lett. 0003-6951, 92, 201916 (2008). 10.1063/1.2929388
-
(2008)
Appl. Phys. Lett.
, vol.92
, pp. 201916
-
-
Tan, T.L.1
Gan, C.L.2
Du, A.Y.3
Cheng, C.K.4
Gambino, J.P.5
-
6
-
-
0035871481
-
-
0921-5093,. 10.1016/S0921-5093(00)01348-4
-
A. Kohn, M. Eizenberg, Y. Shacham-Diamand, and Y. Sverdlov, Mater. Sci. Eng., A 0921-5093, 302, 18 (2001). 10.1016/S0921-5093(00)01348-4
-
(2001)
Mater. Sci. Eng., A
, vol.302
, pp. 18
-
-
Kohn, A.1
Eizenberg, M.2
Shacham-Diamand, Y.3
Sverdlov, Y.4
-
7
-
-
0034830082
-
-
0167-9317,. 10.1016/S0167-9317(00)00460-3
-
A. Kohn, M. Eizenberg, Y. Shacham-Diamand, B. Israel, and Y. Sverdlov, Microelectron. Eng. 0167-9317, 55, 297 (2001). 10.1016/S0167-9317(00)00460-3
-
(2001)
Microelectron. Eng.
, vol.55
, pp. 297
-
-
Kohn, A.1
Eizenberg, M.2
Shacham-Diamand, Y.3
Israel, B.4
Sverdlov, Y.5
-
8
-
-
15744387093
-
-
0013-4651,. 10.1149/1.1860512
-
H. Nakano, T. Itabashi, and H. Akahoshi, J. Electrochem. Soc. 0013-4651, 152, C163 (2005). 10.1149/1.1860512
-
(2005)
J. Electrochem. Soc.
, vol.152
, pp. 163
-
-
Nakano, H.1
Itabashi, T.2
Akahoshi, H.3
-
9
-
-
0000507068
-
-
0003-6951,. 10.1063/1.111408
-
P. J. Ding, W. A. Lanford, S. Hymes, and S. P. Murarka, Appl. Phys. Lett. 0003-6951, 64, 2897 (1994). 10.1063/1.111408
-
(1994)
Appl. Phys. Lett.
, vol.64
, pp. 2897
-
-
Ding, P.J.1
Lanford, W.A.2
Hymes, S.3
Murarka, S.P.4
-
10
-
-
0347375168
-
-
0021-8979,. 10.1063/1.356075
-
P. J. Ding, W. A. Lanford, S. Hymes, and S. P. Murarka, J. Appl. Phys. 0021-8979, 75, 3627 (1994). 10.1063/1.356075
-
(1994)
J. Appl. Phys.
, vol.75
, pp. 3627
-
-
Ding, P.J.1
Lanford, W.A.2
Hymes, S.3
Murarka, S.P.4
-
11
-
-
0037323284
-
-
1099-0062,. 10.1149/1.1534732
-
J. J. Kim, Y. S. Kim, and S. -K. Kim, Electrochem. Solid-State Lett. 1099-0062, 6, C17 (2003). 10.1149/1.1534732
-
(2003)
Electrochem. Solid-State Lett.
, vol.6
, pp. 17
-
-
Kim, J.J.1
Kim, Y.S.2
Kim, S.-K.3
-
13
-
-
28044451073
-
-
0167-9317,. 10.1016/j.mee.2005.07.082
-
H. Einati, V. Bogush, Y. Sverdlov, Y. Rosenberg, and Y. Shacham-Diamand, Microelectron. Eng. 0167-9317, 82, 623 (2005). 10.1016/j.mee.2005.07.082
-
(2005)
Microelectron. Eng.
, vol.82
, pp. 623
-
-
Einati, H.1
Bogush, V.2
Sverdlov, Y.3
Rosenberg, Y.4
Shacham-Diamand, Y.5
-
14
-
-
0029472719
-
-
0956-716X,. 10.1016/0956-716X(95)00473-9
-
R. H. Yu, X. X. Zhang, M. Knobel, and P. Tiberto, Scr. Metall. Mater. 0956-716X, 33, 2045 (1995). 10.1016/0956-716X(95)00473-9
-
(1995)
Scr. Metall. Mater.
, vol.33
, pp. 2045
-
-
Yu, R.H.1
Zhang, X.X.2
Knobel, M.3
Tiberto, P.4
-
15
-
-
0037323106
-
-
0021-8979,. 10.1063/1.1532942
-
M. W. Lane, E. G. Liniger, and J. R. Lloyd, J. Appl. Phys. 0021-8979, 93, 1417 (2003). 10.1063/1.1532942
-
(2003)
J. Appl. Phys.
, vol.93
, pp. 1417
-
-
Lane, M.W.1
Liniger, E.G.2
Lloyd, J.R.3
|