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Volumn 42, Issue 9, 2009, Pages
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Structural and interfacial defects in c-axis oriented LiNbO3 thin films grown by pulsed laser deposition on Si using Al : ZZnO conducting layer
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Author keywords
[No Author keywords available]
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Indexed keywords
AC CONDUCTIVITIES;
AL-DOPED ZNO;
ANTI-SITE DEFECTS;
CONDUCTING LAYERS;
DIELECTRIC CONSTANTS;
INTERDIFFUSION LAYERS;
INTERFACIAL DEFECTS;
OPTIMIZED DEPOSITION CONDITIONS;
OXYGEN PRESSURES;
RAMAN SPECTRUM;
ROTATING SUBSTRATES;
SILICON SUBSTRATES;
SINGLE PHASE;
SUBSTRATE TEMPERATURES;
X- RAY DIFFRACTIONS;
ZNO LAYERS;
ALUMINUM;
CERAMIC CAPACITORS;
DIELECTRIC PROPERTIES;
LIGHT;
NIOBIUM;
OXYGEN;
PHASE INTERFACES;
PULSED LASER DEPOSITION;
RAMAN SPECTROSCOPY;
ROTATION;
SEMICONDUCTING SILICON COMPOUNDS;
SEMICONDUCTING ZINC COMPOUNDS;
SINGLE CRYSTALS;
SPECTROSCOPIC ANALYSIS;
SUBSTRATES;
TRANSITION METALS;
X RAY DIFFRACTION ANALYSIS;
ZINC OXIDE;
CONDUCTIVE FILMS;
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EID: 65449187600
PISSN: 00223727
EISSN: 13616463
Source Type: Journal
DOI: 10.1088/0022-3727/42/9/095303 Document Type: Article |
Times cited : (19)
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References (33)
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