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Volumn 42, Issue 9, 2009, Pages

Structural and interfacial defects in c-axis oriented LiNbO3 thin films grown by pulsed laser deposition on Si using Al : ZZnO conducting layer

Author keywords

[No Author keywords available]

Indexed keywords

AC CONDUCTIVITIES; AL-DOPED ZNO; ANTI-SITE DEFECTS; CONDUCTING LAYERS; DIELECTRIC CONSTANTS; INTERDIFFUSION LAYERS; INTERFACIAL DEFECTS; OPTIMIZED DEPOSITION CONDITIONS; OXYGEN PRESSURES; RAMAN SPECTRUM; ROTATING SUBSTRATES; SILICON SUBSTRATES; SINGLE PHASE; SUBSTRATE TEMPERATURES; X- RAY DIFFRACTIONS; ZNO LAYERS;

EID: 65449187600     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/42/9/095303     Document Type: Article
Times cited : (19)

References (33)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.