Quantitative evaluation of radiation damage to polyethylene terephthalate by soft X-rays and high-energy electrons

Journal of Physical Chemistry B

Volumn 113, Issue 7, 2009, Pages 1869-1876

  Wang, Jian ^a   Botton, Gianluigi A ^a   West, Marcia M ^a   Hitchcock, Adam P ^a  

^a MCMASTER UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

AIRCRAFT PARTS AND EQUIPMENT; ATOMS; ELECTRON BEAMS; ELECTRONS; ESTERS; MICROSCOPES; POLYESTERS; POLYETHYLENE TEREPHTHALATES; POSITRON EMISSION TOMOGRAPHY; RADIATION CHEMISTRY; RADIATION DAMAGE; SUN; TRANSMISSION ELECTRON MICROSCOPY; UNCERTAINTY ANALYSIS; X RAY ABSORPTION NEAR EDGE STRUCTURE SPECTROSCOPY; X RAY LITHOGRAPHY;

CHEMICAL CHANGES; DAMAGE PATTERNS; DAMAGE PROCESS; DOSE RATES; ELECTRON BEAM DAMAGES; ENERGETIC ELECTRONS; ESTER BONDS; HIGH-ENERGY ELECTRONS; MEASUREMENT UNCERTAINTIES; QUANTITATIVE EVALUATIONS; SECONDARY PROCESS; SOFT X-RAYS; SPECTRAL CHANGES; SPECTRAL FEATURES; TRANSMISSION ELECTRON MICROSCOPES; [CARBONYL;

X RAYS;

EID: 65249100759     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp808289e     Document Type: Article

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