-
2
-
-
33847741075
-
-
Wang, J.; Stöver, H. D. H.; Hitchcock, A. P.; Tyliszczak, T. J. Synchrotron Radiât. 2007, 14, 181.
-
(2007)
J. Synchrotron Radiât
, vol.14
, pp. 181
-
-
Wang, J.1
Stöver, H.D.H.2
Hitchcock, A.P.3
Tyliszczak, T.4
-
3
-
-
77956656502
-
-
Samson, J. A. R, Ederer, D. L, Eds, Academic Press: New York
-
Ade, H. In Experimental Methods in the Physical Sciences; Samson, J. A. R., Ederer, D. L., Eds.; Academic Press: New York, 1998; Vol. 32, p 225.
-
(1998)
Experimental Methods in the Physical Sciences
, vol.32
, pp. 225
-
-
Ade, H.1
-
4
-
-
0003946437
-
-
Sham, T. K, Ed, World Scientific Publishing: River Edge, NJ
-
Ade, H.; Urquhart, S. G. In Chemical Applications of Synchrotron Radiation; Sham, T. K., Ed.; World Scientific Publishing: River Edge, NJ, 2002.
-
(2002)
Chemical Applications of Synchrotron Radiation
-
-
Ade, H.1
Urquhart, S.G.2
-
5
-
-
0036657957
-
-
Warwick, T.; Ade, H.; Kilcoyne, D.; Kritscher, M.; Tyliszczak, T.; Fakra, S.; Hitchcock, A.; Hitchcock, P.; Padmore, H. J. Synchrotron Radiat. 2002, 9, 254.
-
(2002)
J. Synchrotron Radiat
, vol.9
, pp. 254
-
-
Warwick, T.1
Ade, H.2
Kilcoyne, D.3
Kritscher, M.4
Tyliszczak, T.5
Fakra, S.6
Hitchcock, A.7
Hitchcock, P.8
Padmore, H.9
-
6
-
-
0344942583
-
-
Kilcoyne, A. L. D.; Tyliszczak, T.; Steele, F.; Fakra, S.; Hitchcock, P.; Franck, K.; Anderson, E.; Harteneck, B.; Rightor, E. G.; Mitchell, G. E.; Hitchcock, A. P.; Yang, L.; Warwick, T.; Ade, H. J. Synchrotron Radiat. 2003, 10, 125.
-
(2003)
J. Synchrotron Radiat
, vol.10
, pp. 125
-
-
Kilcoyne, A.L.D.1
Tyliszczak, T.2
Steele, F.3
Fakra, S.4
Hitchcock, P.5
Franck, K.6
Anderson, E.7
Harteneck, B.8
Rightor, E.G.9
Mitchell, G.E.10
Hitchcock, A.P.11
Yang, L.12
Warwick, T.13
Ade, H.14
-
7
-
-
36348987660
-
-
in press
-
Wang, J.; Morin, C.; Li, L.; Hitchcock, A. P.; Scholl, A.; Doran, A. J. Electron Spectrosc. Relat. Phenom. 2007, in press.
-
(2007)
J. Electron Spectrosc. Relat. Phenom
-
-
Wang, J.1
Morin, C.2
Li, L.3
Hitchcock, A.P.4
Scholl, A.5
Doran, A.6
-
8
-
-
0029346240
-
-
Zhang, X.; Jacobsen, C.; Lindaas, S.; Williams, S. J. Vac. Sci. Technol., B 1995, 13, 1477.
-
(1995)
Vac. Sci. Technol., B
, vol.13
, pp. 1477
-
-
Zhang, X.1
Jacobsen, C.2
Lindaas, S.3
Williams, S.J.4
-
9
-
-
0031100276
-
-
Rightor, E. G.; Hitchcock, A. P.; Ade, H.; Leapman, R. D.; Urquhart, S. G.; Smith, A. P.; Mitchell, G.; Fischer, D.; Shin, H. J.; Warwick, T. J. Phys. Chem. B 1997, 101, 1950.
-
(1997)
J. Phys. Chem. B
, vol.101
, pp. 1950
-
-
Rightor, E.G.1
Hitchcock, A.P.2
Ade, H.3
Leapman, R.D.4
Urquhart, S.G.5
Smith, A.P.6
Mitchell, G.7
Fischer, D.8
Shin, H.J.9
Warwick, T.10
-
11
-
-
0036132956
-
-
Coffey, T.; Urquhart, S. G.; Ade, H. J. Electron Spectrosc. Relat. Phenom. 2002, 122, 65.
-
(2002)
J. Electron Spectrosc. Relat. Phenom
, vol.122
, pp. 65
-
-
Coffey, T.1
Urquhart, S.G.2
Ade, H.3
-
12
-
-
36348995368
-
-
aXis2000 is an application written in Interactive Data Language. It is available free for noncommercial applications at http://unicorn.mcmaster.ca/ aXis2000.html.
-
aXis2000 is an application written in Interactive Data Language. It is available free for noncommercial applications at http://unicorn.mcmaster.ca/ aXis2000.html.
-
-
-
-
13
-
-
2342561300
-
-
Egerton, R. F.; Li, P.; Malac, M. Micron 2004, 35, 399.
-
(2004)
Micron
, vol.35
, pp. 399
-
-
Egerton, R.F.1
Li, P.2
Malac, M.3
-
14
-
-
0037117868
-
-
Frey, S.; Rong, H.-T.; Heister, K.; Yang, Y.-J.; Buck, M.; Zharnikov, M. Langmuir 2002, 18, 3142.
-
(2002)
Langmuir
, vol.18
, pp. 3142
-
-
Frey, S.1
Rong, H.-T.2
Heister, K.3
Yang, Y.-J.4
Buck, M.5
Zharnikov, M.6
-
18
-
-
31844448318
-
-
Nakano, A.; Okamoto, K.; Yamamoto, Y.; Kozawa, T.; Tagawa, S.; Kai, T.; Nemoto, H. Jpn. J. Appl. Phys. 2005, 44, 5832.
-
(2005)
Jpn. J. Appl. Phys
, vol.44
, pp. 5832
-
-
Nakano, A.1
Okamoto, K.2
Yamamoto, Y.3
Kozawa, T.4
Tagawa, S.5
Kai, T.6
Nemoto, H.7
-
19
-
-
33644636247
-
-
Richter, A. G.; Guico, R.; Shull, K.; Wang, J. Macromolecules 2006, 39, 1545.
-
(2006)
Macromolecules
, vol.39
, pp. 1545
-
-
Richter, A.G.1
Guico, R.2
Shull, K.3
Wang, J.4
-
20
-
-
0037942454
-
-
Choi, J.; Manohara, H. M.; Morikawa, E.; Sprunger, P. T.; Dowben, P. A.; Palto, S. P. Appl. Phys. Lett. 2000, 76, 381.
-
(2000)
Appl. Phys. Lett
, vol.76
, pp. 381
-
-
Choi, J.1
Manohara, H.M.2
Morikawa, E.3
Sprunger, P.T.4
Dowben, P.A.5
Palto, S.P.6
-
21
-
-
0038359746
-
-
La, Y.-H.; Jung, Y. J.; Kim, H. J.; Kang, T.-H.; Ihm, K.; Kim, K.-J.; Kim, B.; Park, J. W. Langmuir 2003, 19, 4390.
-
(2003)
Langmuir
, vol.19
, pp. 4390
-
-
La, Y.-H.1
Jung, Y.J.2
Kim, H.J.3
Kang, T.-H.4
Ihm, K.5
Kim, K.-J.6
Kim, B.7
Park, J.W.8
-
22
-
-
1842582770
-
-
Klauser, R.; Huang, M.-L.; Wang, S.-C.; Chen, C.-H.; Chuang, T. J.; Terfort, A.; Zharnikov, M. Langmuir 2004, 20, 2050.
-
(2004)
Langmuir
, vol.20
, pp. 2050
-
-
Klauser, R.1
Huang, M.-L.2
Wang, S.-C.3
Chen, C.-H.4
Chuang, T.J.5
Terfort, A.6
Zharnikov, M.7
-
23
-
-
17444374958
-
-
Klauser, R.; Chen, C.-H.; Huang, M.-L.; Wang, S.-C.; Chuang, T. J.; Zharnikov, M. J. Electron Spectrosc. Relat. Phenom. 2005, 744-747, 393.
-
(2005)
J. Electron Spectrosc. Relat. Phenom
, vol.744-747
, pp. 393
-
-
Klauser, R.1
Chen, C.-H.2
Huang, M.-L.3
Wang, S.-C.4
Chuang, T.J.5
Zharnikov, M.6
-
24
-
-
0003649450
-
-
Berreman, D. W.; Bjorkholm, J. E.; Becker, M.; Eichner, L.; Freeman, R. R.; Jewell, T. E.; Mansfield, W. M.; MacDowell, A. A.; O'Malley, M. L.; Raab, E. L.; Silfvast, W. T.; Szeto, L. H.; Tennant, D. M.; Waskiewicz, W. K.; White, D. L.; Windt, D. L.; Wood, O. R., II. Appl. Phys. Lett. 1990, 56, 2180.
-
(1990)
Appl. Phys. Lett
, vol.56
, pp. 2180
-
-
Berreman, D.W.1
Bjorkholm, J.E.2
Becker, M.3
Eichner, L.4
Freeman, R.R.5
Jewell, T.E.6
Mansfield, W.M.7
MacDowell, A.A.8
O'Malley, M.L.9
Raab, E.L.10
Silfvast, W.T.11
Szeto, L.H.12
Tennant, D.M.13
Waskiewicz, W.K.14
White, D.L.15
Windt, D.L.16
Wood II, O.R.17
-
25
-
-
0009040970
-
-
Rooks, M. J.; Eugster, C. C.; del Alamo, J. A.; Snider, G. L.; Hu, E. L. J. Vac. Sci. Technol., B 1991, 9, 2856.
-
(1991)
J. Vac. Sci. Technol., B
, vol.9
, pp. 2856
-
-
Rooks, M.J.1
Eugster, C.C.2
del Alamo, J.A.3
Snider, G.L.4
Hu, E.L.5
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