Comparison of NEXAFS microscopy and TEM-EELS for studies of soft matter (DOI:10.1016/j.micron.2007.09.008);Comparison of NEXAFS microscopy and TEM-EELS for studies of soft matter

Micron

Volumn 39, Issue 3, 2008, Pages 311-319

  Hitchcock, Adam P ^a   Dynes, James J ^a   Johansson, Göran ^a   Wang, Jian ^a   Botton, Gianluigi ^a,b  

^a MCMASTER UNIVERSITY   (Canada)

^b MCMASTER UNIVERSITY   (Canada)

Author keywords

EELS; NEXAFS microscopy; Radiation damage; STXM; TEM; Tomography

Indexed keywords

ELECTRON ENERGY LOSS SPECTROSCOPY; RADIATION DAMAGE; TOMOGRAPHY; X RAY ABSORPTION NEAR EDGE STRUCTURE SPECTROSCOPY; X RAY ANALYSIS;

EXPLICIT COMPARISONS; INNER SHELL SPECTROSCOPY;

TRANSMISSION ELECTRON MICROSCOPY;

EID: 39549089076     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.micron.2007.09.010     Document Type: Erratum

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