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Physical Review B - Condensed Matter and Materials Physics

Volumn 79, Issue 9, 2009, Pages

Theoretical basis of parametric-resonance-based atomic force microscopy

(4) Prakash, G a Hu, S b Raman, A a Reifenberger, R a

a PURDUE UNIVERSITY (United States)

b Veeco Metrology (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 64849087602 PISSN: 10980121 EISSN: 1550235X Source Type: Journal
DOI: 10.1103/PhysRevB.79.094304 Document Type: Article

Times cited : (29)

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