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Volumn 404, Issue 8-11, 2009, Pages 1097-1101

A novel phenomenon: p-Type ZnO:Al films deposited on n-Si substrate

Author keywords

Al doped p type ZnO; Oxygen ambient; RF magnetron sputtering

Indexed keywords

ACCEPTOR LEVELS; AL-DOPED P-TYPE ZNO; AL-DOPED ZNO; AMBIENT OXYGENS; CALCULATED VALUES; COMPACT STRUCTURES; CROSS-SECTION IMAGES; DONOR LEVELS; FIELD EMISSION-SCANNING ELECTRON MICROSCOPIES; HOMO-BUFFER LAYERS; OXYGEN AMBIENT; P TYPES; P-TYPE ZNO; P-TYPE ZNO FILMS; PHOTOLUMINESCENCE SPECTRUM; RF MAGNETRON SPUTTERING; SHOULDER PEAKS; SI SUBSTRATES; SI(1 0 0 ); SPUTTERING TARGETS; XRD SPECTRUM; ZNO CERAMICS;

EID: 64549147069     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physb.2008.11.078     Document Type: Article
Times cited : (12)

References (23)
  • 23
    • 50249160200 scopus 로고    scopus 로고
    • H. Jin, Y. Kim, C. Park, in: The Third IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2008, pp. 288-291.
    • H. Jin, Y. Kim, C. Park, in: The Third IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2008, pp. 288-291.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.