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Volumn 404, Issue 8-11, 2009, Pages 1097-1101
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A novel phenomenon: p-Type ZnO:Al films deposited on n-Si substrate
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Author keywords
Al doped p type ZnO; Oxygen ambient; RF magnetron sputtering
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Indexed keywords
ACCEPTOR LEVELS;
AL-DOPED P-TYPE ZNO;
AL-DOPED ZNO;
AMBIENT OXYGENS;
CALCULATED VALUES;
COMPACT STRUCTURES;
CROSS-SECTION IMAGES;
DONOR LEVELS;
FIELD EMISSION-SCANNING ELECTRON MICROSCOPIES;
HOMO-BUFFER LAYERS;
OXYGEN AMBIENT;
P TYPES;
P-TYPE ZNO;
P-TYPE ZNO FILMS;
PHOTOLUMINESCENCE SPECTRUM;
RF MAGNETRON SPUTTERING;
SHOULDER PEAKS;
SI SUBSTRATES;
SI(1 0 0 );
SPUTTERING TARGETS;
XRD SPECTRUM;
ZNO CERAMICS;
BUFFER LAYERS;
CRYSTAL STRUCTURE;
EMISSION SPECTROSCOPY;
FIELD EMISSION;
HALL EFFECT;
MAGNETIC FIELD EFFECTS;
MAGNETRON SPUTTERING;
MAGNETRONS;
METALLIC FILMS;
OPTICAL FILMS;
OXYGEN;
SCANNING ELECTRON MICROSCOPY;
SEMICONDUCTING SILICON COMPOUNDS;
SEMICONDUCTING ZINC COMPOUNDS;
THIN FILMS;
ZINC OXIDE;
ALUMINUM;
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EID: 64549147069
PISSN: 09214526
EISSN: None
Source Type: Journal
DOI: 10.1016/j.physb.2008.11.078 Document Type: Article |
Times cited : (12)
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References (23)
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