Electrical and microstructural characterisation of microcrystalline silicon layers and solar cells

Proceedings of the 3rd World Conference on Photovoltaic Energy Conversion

Volumn B, Issue , 2003, Pages 1544-1547

  Droz, Corinne ^a   Vallat Sauvain, Evelyne ^a   Bailat, Julien ^a   Feitknecht, Luc ^a   Meier, Johannes ^a   Niquille, Xavier ^a   Shah, Arvind ^a  

^a UNIVERSITY OF NEUCHÂTEL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFUSION LENGTH; NANOCRYSTALS; PLASMA GAS; SILICON LAYERS;

ATOMIC FORCE MICROSCOPY; CRYSTAL STRUCTURE; MICROSTRUCTURE; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; SOLAR CELLS; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; X RAY ANALYSIS;

SILICON;

EID: 6444243063     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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