Thickness dependence of microcrystalline silicon solar cell properties

Solar Energy Materials and Solar Cells

Volumn 66, Issue 1-4, 2001, Pages 345-351

  Vetterl, O ^a   Lambertz, A ^a   Dasgupta, A ^b   Finger, F ^a   Rech, B ^a   Kluth, O ^a   Wagner, H ^a  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

^b DEPARTMENT OF MATERIALS SCIENCE   (India)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLINE MATERIALS; DEPOSITION; LIGHT ABSORPTION; SHORT CIRCUIT CURRENTS; THIN FILM DEVICES;

MICROCRYSTALLINE SILICON; OPEN CIRCUIT VOLTAGE; REVERSE DEPOSITION SEQUENCE;

SILICON SOLAR CELLS;

EID: 0035254870     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0927-0248(00)00193-8     Document Type: Article

References (7)

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6. O. Kluth, O. Vetterl, R. Carius, F. Finger, S. Wieder, B. Rech, H. Wagner, Mater. Res. Soc. Symp. Proc. 557 (1999), p.731.
7. Sze S.M. Physics of Semiconductor Devices. 2nd Edition:1981;Wiley, New York.