SCOPUS 정보 검색 플랫폼

Journal of Applied Physics

Volumn 105, Issue 6, 2009, Pages

Effect of thermal processing on silver thin films of varying thickness deposited on zinc oxide and indium tin oxide

(4) Sivaramakrishnan, K a Ngo, A T a Iyer, S b Alford, T L a

a ARIZONA STATE UNIVERSITY (United States)

b North Carolina Agricultural and Technical State University (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ABRUPT CHANGES; AFM; AG FILMS; ANNEALED FILMS; ATOMIC-FORCE MICROSCOPIES; AVERAGE SURFACE ROUGHNESS; CRYSTALLINITY; DEGREE OF TEXTURING; FOUR POINT PROBES; IN VACUUMS; INDIUM TIN OXIDES; INTERFACE ENERGIES; ONSET TEMPERATURES; OSTWALD RIPENING THEORIES; RESISTIVITY BEHAVIORS; RESISTIVITY CHANGES; RUTHERFORD BACK-SCATTERING SPECTROMETRIES; SILVER FILMS; SILVER THIN FILMS; THERMAL PROCESSING; VARYING THICKNESS; X-RAY POLE FIGURE ANALYSIS; ZNO;

AGGLOMERATION; ANNEALING; ATOMIC FORCE MICROSCOPY; CRYSTAL GROWTH; ELECTRODEPOSITION; INDIUM; METAL ANALYSIS; OSTWALD RIPENING; OXIDE FILMS; PHOTOLITHOGRAPHY; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SEMICONDUCTING SILICON COMPOUNDS; SURFACE PROPERTIES; SURFACE ROUGHNESS; TEXTURING; TIN; TITANIUM COMPOUNDS; ZINC; ZINC OXIDE;

SILVER;

EID: 63749124519 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3100043 Document Type: Article

Times cited : (22)

References (29)

1
- 34249288316
- 0040-6090 10.1016/j.tsf.2007.03.014.
- G. J. Exarhos and X. D. Zhou, Thin Solid Films 0040-6090 10.1016/j.tsf.2007.03.014 515, 7025 (2007).
- (2007) Thin Solid Films , vol.515 , pp. 7025
- Exarhos, G.J.¹ Zhou, X.D.²

2
- 0037157419
- 0040-6090 10.1016/S0040-6090(02)00163-3.
- C. G. Granqvist and A. Hultaker, Thin Solid Films 0040-6090 10.1016/S0040-6090(02)00163-3 411, 1 (2002).
- (2002) Thin Solid Films , vol.411 , pp. 1
- Granqvist, C.G.¹ Hultaker, A.²

3
- 0034251416
- 0883-7694
- R. G. Gordon, MRS Bull. 25, 52 (2000). 0883-7694
- (2000) MRS Bull. , vol.25 , pp. 52
- Gordon, R.G.¹

4
- 0034247086
- 0883-7694
- B. G. Lewis and D. C. Paine, MRS Bull. 25, 22 (2000). 0883-7694
- (2000) MRS Bull. , vol.25 , pp. 22
- Lewis, B.G.¹ Paine, D.C.²

5
- 17044403452
- 0268-1242 10.1088/0268-1242/20/4/004.
- T. Minami, Semicond. Sci. Technol. 0268-1242 10.1088/0268-1242/20/4/004 20, S35 (2005).
- (2005) Semicond. Sci. Technol. , vol.20 , pp. 35
- Minami, T.¹

6
- 27744581499
- 0021-8979 10.1063/1.2106013.
- H. Han, D. Adams, J. W. Mayer, and T. L. Alford, J. Appl. Phys. 0021-8979 10.1063/1.2106013 98, 083705 (2005).
- (2005) J. Appl. Phys. , vol.98 , pp. 083705
- Han, H.¹ Adams, D.² Mayer, J.W.³ Alford, T.L.⁴

7
- 18244430368
- 0031-9007 10.1103/PhysRevLett.85.1012.
- C. G. Van de Walle, Phys. Rev. Lett. 0031-9007 10.1103/PhysRevLett.85. 1012 85, 1012 (2000).
- (2000) Phys. Rev. Lett. , vol.85 , pp. 1012
- Van De Walle, C.G.¹

8
- 34249001267
- 0370-1972 10.1002/pssb.200675101.
- N. Izyumskaya, V. Avrutin, U. Ozugar, Y. I. Alivov, and H. Morkoc, Phys. Status Solidi B 0370-1972 10.1002/pssb.200675101 244, 1439 (2007).
- (2007) Phys. Status Solidi B , vol.244 , pp. 1439
- Izyumskaya, N.¹ Avrutin, V.² Ozugar, U.³ Alivov, Y.I.⁴ Morkoc, H.⁵

9
- 9944236821
- 0040-6090 10.1016/j.tsf.2004.07.083.
- X. Fang, T. Ma, M. Akiyama, G. Guan, S. Tsunematsu, and E. Abe, Thin Solid Films 0040-6090 10.1016/j.tsf.2004.07.083 472, 242 (2005).
- (2005) Thin Solid Films , vol.472 , pp. 242
- Fang, X.¹ Ma, T.² Akiyama, M.³ Guan, G.⁴ Tsunematsu, S.⁵ Abe, E.⁶

10
- 33748804159
- 0038-1098 10.1016/j.ssc.2006.08.027.
- A. Anders, E. Byon, D. Kim, K. Fukuda, and S. H. N. Lim, Solid State Commun. 0038-1098 10.1016/j.ssc.2006.08.027 140, 225 (2006).
- (2006) Solid State Commun. , vol.140 , pp. 225
- Anders, A.¹ Byon, E.² Kim, D.³ Fukuda, K.⁴ Lim, S.H.N.⁵

11
- 42649146254
- K. Fukuda, S. H. N. Lim, and A. Anders, Thin Solid Films 516, 4546 (2008).
- (2008) Thin Solid Films , vol.516 , pp. 4546
- Fukuda, K.¹ Lim, S.H.N.² Anders, A.³

12
- 0022075813
- 0168-583X 10.1016/0168-583X(85)90762-1.
- L. R. Doolittle, Nucl. Instrum. Methods Phys. Res. B 0168-583X 10.1016/0168-583X(85)90762-1 9, 344 (1985).
- (1985) Nucl. Instrum. Methods Phys. Res. B , vol.9 , pp. 344
- Doolittle, L.R.¹

13
- 57049138788
- 0021-8979 10.1063/1.2800998.
- Y. Zoo, H. Han, and T. L. Alford, J. Appl. Phys. 0021-8979 10.1063/1.2800998 102, 083548 (2007).
- (2007) J. Appl. Phys. , vol.102 , pp. 083548
- Zoo, Y.¹ Han, H.² Alford, T.L.³

14
- 0033723624
- 0040-6090 10.1016/S0040-6090(00)00972-X.
- I. Tomov, M. Adamik, and P. B. Barna, Thin Solid Films 0040-6090 10.1016/S0040-6090(00)00972-X 371, 17 (2000).
- (2000) Thin Solid Films , vol.371 , pp. 17
- Tomov, I.¹ Adamik, M.² Barna, P.B.³

15
- 2442486807
- 0021-8979 10.1063/1.1682685.
- H. C. Kim, N. D. Theodore, and T. L. Alford, J. Appl. Phys. 0021-8979 10.1063/1.1682685 95, 5180 (2004).
- (2004) J. Appl. Phys. , vol.95 , pp. 5180
- Kim, H.C.¹ Theodore, N.D.² Alford, T.L.³

16
- 0003470014
- (Holt, Rinehart and Winston, New York).
- N. W. Ashcroft and N. D. Mermin, Solid State Physics (Holt, Rinehart and Winston, New York, 1976).
- (1976) Solid State Physics
- Ashcroft, N.W.¹ Mermin, N.D.²

17
- 35148817514
- 1359-6454 10.1016/j.actamat.2007.07.040.
- J. R. Greer and R. A. Street, Acta Mater. 1359-6454 10.1016/j.actamat. 2007.07.040 55, 6345 (2007).
- (2007) Acta Mater. , vol.55 , pp. 6345
- Greer, J.R.¹ Street, R.A.²

18
- 0242272315
- 0021-8979 10.1063/1.1609646.
- H. C. Kim and T. L. Alford, J. Appl. Phys. 0021-8979 10.1063/1.1609646 94, 5393 (2003).
- (2003) J. Appl. Phys. , vol.94 , pp. 5393
- Kim, H.C.¹ Alford, T.L.²

19
- 0034227055
- 0921-4534
- D. Soh, Y. Shan, J. Park, Y. Li, and Y. Cho, Physica C 337, 44 (2000). 0921-4534
- (2000) Physica C , vol.337 , pp. 44
- Soh, D.¹ Shan, Y.² Park, J.³ Li, Y.⁴ Cho, Y.⁵

20
- 0345603152
- 0169-4332 10.1016/S0169-4332(03)00888-2.
- Y. S. Jung, Appl. Surf. Sci. 0169-4332 10.1016/S0169-4332(03)00888-2 221, 281 (2004).
- (2004) Appl. Surf. Sci. , vol.221 , pp. 281
- Jung, Y.S.¹

21
- 21744452374
- 0734-2101 10.1116/1.580591.
- T. J. Klemmer, V. R. Inturi, and J. A. Barnard, J. Vac. Sci. Technol. A 0734-2101 10.1116/1.580591 15, 1190 (1997).
- (1997) J. Vac. Sci. Technol. A , vol.15 , pp. 1190
- Klemmer, T.J.¹ Inturi, V.R.² Barnard, J.A.³

22
- 0027593101
- 0022-0248 10.1016/0022-0248(93)90861-P.
- N. Fujimura, T. Nishikara, S. Goto, J. Xu, and T. Ito, J. Cryst. Growth 0022-0248 10.1016/0022-0248(93)90861-P 130, 269 (1993).
- (1993) J. Cryst. Growth , vol.130 , pp. 269
- Fujimura, N.¹ Nishikara, T.² Goto, S.³ Xu, J.⁴ Ito, T.⁵

23
- 33845617603
- 0361-5235 10.1007/s11664-002-0173-9.
- A. E. Lita and J. E. Sanchez, J. Electron. Mater. 0361-5235 10.1007/s11664-002-0173-9 31, 55 (2002).
- (2002) J. Electron. Mater. , vol.31 , pp. 55
- Lita, A.E.¹ Sanchez, J.E.²

24
- 63749103697
- 1431-9276
- D. R. Waryoba and P. N. Kalu, Microsc. Microanal. 11, 1694 (2005). 1431-9276
- (2005) Microsc. Microanal. , vol.11 , pp. 1694
- Waryoba, D.R.¹ Kalu, P.N.²

25
- 84891005643
- (Wiley-VCH, Germany).
- M. Birkholz, Thin Film Analysis by X-Ray Scattering (Wiley-VCH, Germany, 2006).
- (2006) Thin Film Analysis by X-Ray Scattering
- Birkholz, M.¹

26
- 36549102678
- 0003-6951 10.1063/1.98781.
- M. Zinke-Allmang, L. C. Feldman, and S. Nakahara, Appl. Phys. Lett. 0003-6951 10.1063/1.98781 51, 975 (1987).
- (1987) Appl. Phys. Lett. , vol.51 , pp. 975
- Zinke-Allmang, M.¹ Feldman, L.C.² Nakahara, S.³

27
- 0004141013
- (Macmillan, New York).
- K. Tu, J. W. Mayer, and L. C. Feldman, Electronic Thin Film Science (Macmillan, New York, 1992).
- (1992) Electronic Thin Film Science
- Tu, K.¹ Mayer, J.W.² Feldman, L.C.³

28
- 34548011731
- 0021-8979 10.1063/1.2761822.
- H. Han, Y. Zoo, J. W. Mayer, and T. L. Alford, J. Appl. Phys. 0021-8979 10.1063/1.2761822 102, 036101 (2007).
- (2007) J. Appl. Phys. , vol.102 , pp. 036101
- Han, H.¹ Zoo, Y.² Mayer, J.W.³ Alford, T.L.⁴

29
- 0344861690
- 0098-4558
- D. J. Srolovitz and M. G. Goldiner, JOM 47, 31 (1995). 0098-4558
- (1995) JOM , vol.47 , pp. 31
- Srolovitz, D.J.¹ Goldiner, M.G.²

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.