Circuit implementation to describe the physical behavior of phase change memory

2008 IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC

Volumn , Issue , 2008, Pages

  Kwong, K C ^a   Chan, Mansun ^a  

^a HONG KONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Hong Kong)

Author keywords

[No Author keywords available]

Indexed keywords

PHASE CHANGE MEMORY; PULSE CODE MODULATION; SOLID STATE DEVICES;

CIRCUIT ELEMENTS; CIRCUIT IMPLEMENTATIONS; CIRCUIT MODELS; DATA RETENTIONS; DEVELOPED MODELS; OPERATION MODES; PHASE-CHANGE MEMORIES; PHYSICAL BEHAVIORS; PHYSICAL EFFECTS; SELF-HEATING; SUB-CIRCUITS;

ELECTRIC NETWORK ANALYSIS;

EID: 63249084622     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/EDSSC.2008.4760753     Document Type: Conference Paper

References (9)

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8. Ovonyx Inc., Technical presentation titled "Ovonic unified memory", slide 21, 1999.
9. Ugo Russo, Daniele Ielmini, Andrea Redaelli and Andrea L. Lacaita, "Intrinsic data retention in nanoscaled phase-change memories-part 1: monte carlo model for crystallization and percolation", IEEE TED, vol. 53, no. 12, December 2006.