Nucleation switching in phase change memory

Applied Physics Letters

Volumn 90, Issue 12, 2007, Pages

  Karpov, V G ^a   Kryukov, Y A ^a   Savransky, S D ^b   Karpov, I V ^b  

^a UNIVERSITY OF TOLEDO   (United States)

^b INTEL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CORRELATION METHODS; CRYSTALLINE MATERIALS; DELAY CIRCUITS; NUCLEATION; PARAMETER ESTIMATION; SWITCHING; THRESHOLD VOLTAGE;

AMORPHOUS LAYER THICKNESS; CONDUCTIVE CYLINDRICAL CRYSTALLITES; MATERIAL PARAMETERS;

PHASE CHANGE MEMORY;

EID: 33947572504     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2715024     Document Type: Article

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