Efficient grouping of fail chips for volume Yield diagnostics

Proceedings: 22nd International Conference on VLSI Design - Held Jointly with 7th International Conference on Embedded Systems

Volumn , Issue , 2009, Pages 97-102

  Jagan, Lavanya ^a   Singh, Ratan Deep ^a   Kamakoti, V ^a   Majhi, Ananta K ^b  

^a INDIAN INSTITUTE OF TECHNOLOGY MADRAS   (India)

^b NXP SEMICONDUCTORS   (Netherlands)

Author keywords

Clustering; Fail signatures; Systematic defects; Volume Yield diagnostics; Yield

Indexed keywords

INTEGRATED CIRCUITS; VANADIUM COMPOUNDS;

CLUSTERING; FAIL SIGNATURES; SYSTEMATIC DEFECTS; VOLUME YIELD DIAGNOSTICS; YIELD;

EMBEDDED SYSTEMS;

EID: 62949119287     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VLSI.Design.2009.59     Document Type: Conference Paper

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