Hybrid Multisite Testing at Manufacturing

IEEE International Test Conference (TC)

Volumn , Issue , 2003, Pages 927-936

  Hashempour, H ^a   Meyer, F J ^a   Lombardi, F ^a   Karimi, F ^b  

^a NORTHEASTERN UNIVERSITY   (United States)

^b LTX Corp   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

APPLICATION SPECIFIC INTEGRATED CIRCUITS; BUILT-IN SELF TEST; MICROPROCESSOR CHIPS; PROBABILITY;

HYBRID MULTISITE TESTING;

VLSI CIRCUITS;

EID: 0142215946     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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