-
2
-
-
27844553902
-
Residual stresses in titanium nitride thin films deposited by direct current and pulsed direct current unbalanced magnetron sputtering
-
Benegra M., Lamas D.G., Fernández de Rapp M.E., et al. Residual stresses in titanium nitride thin films deposited by direct current and pulsed direct current unbalanced magnetron sputtering. Thin Solid Films 494 (2006) 146-150
-
(2006)
Thin Solid Films
, vol.494
, pp. 146-150
-
-
Benegra, M.1
Lamas, D.G.2
Fernández de Rapp, M.E.3
-
3
-
-
62849096025
-
-
Mittal K.L., and Hopewell Junction N.Y. (Eds), American Society for Testing and Materials, Philadelphia
-
Bascom W.D., Becher P.F., Bitner J.L., and Murday J.S. In: Mittal K.L., and Hopewell Junction N.Y. (Eds). Adhesion Measurement of Thin Films, Thick Films and Bulk Coatings (1976), American Society for Testing and Materials, Philadelphia 63-79
-
(1976)
Adhesion Measurement of Thin Films, Thick Films and Bulk Coatings
, pp. 63-79
-
-
Bascom, W.D.1
Becher, P.F.2
Bitner, J.L.3
Murday, J.S.4
-
4
-
-
0029209512
-
Mechanical modelling of blisters on coated laminates I - theoretical aspects
-
Castaing P., Lemoine L., and Gourdenne A. Mechanical modelling of blisters on coated laminates I - theoretical aspects. Comput. Struct. 30 (1995) 217-222
-
(1995)
Comput. Struct.
, vol.30
, pp. 217-222
-
-
Castaing, P.1
Lemoine, L.2
Gourdenne, A.3
-
5
-
-
0029220457
-
Mechanical modelling of blisters on coated laminates II - experimental analysis
-
Castaing P., Lemoine L., and Gourdenne A. Mechanical modelling of blisters on coated laminates II - experimental analysis. Comput. Struct. 30 (1995) 223-228
-
(1995)
Comput. Struct.
, vol.30
, pp. 223-228
-
-
Castaing, P.1
Lemoine, L.2
Gourdenne, A.3
-
8
-
-
0032148208
-
Adhesion and debonding of multi-layer thin film structures
-
Dauskardt R.H., Lane M., Ma Q., and Krishna N. Adhesion and debonding of multi-layer thin film structures. Eng. Fract. Mech. 61 (1998) 141-162
-
(1998)
Eng. Fract. Mech.
, vol.61
, pp. 141-162
-
-
Dauskardt, R.H.1
Lane, M.2
Ma, Q.3
Krishna, N.4
-
10
-
-
0042244391
-
Interfacial fracture induced by cross-sectional nanoindentation in metal-ceramic thin film structures
-
Elizalde M.R., Sánchez J.M., Molina-Aldareguia J.M., et al. Interfacial fracture induced by cross-sectional nanoindentation in metal-ceramic thin film structures. Acta Mater. 51 (2003) 4295-4305
-
(2003)
Acta Mater.
, vol.51
, pp. 4295-4305
-
-
Elizalde, M.R.1
Sánchez, J.M.2
Molina-Aldareguia, J.M.3
-
12
-
-
0029346335
-
The thermomechanical integrity of thin films and multilayers
-
Evans A.G., and Hutchinson J.W. The thermomechanical integrity of thin films and multilayers. Acta Metall. Mater. 43 (1995) 2507-2530
-
(1995)
Acta Metall. Mater.
, vol.43
, pp. 2507-2530
-
-
Evans, A.G.1
Hutchinson, J.W.2
-
13
-
-
0142159473
-
-
Cambridge University Press, Cambridge, UK
-
Freund L.B., and Suresh S. Thin film materials: stress, defect formation and surface evolution (2003), Cambridge University Press, Cambridge, UK
-
(2003)
Thin film materials: stress, defect formation and surface evolution
-
-
Freund, L.B.1
Suresh, S.2
-
14
-
-
12244265844
-
A bending-to-stretching analysis of the blister test in the presence of tensile residual stress
-
Guo S., Wan K.-T., and Dillard D.A. A bending-to-stretching analysis of the blister test in the presence of tensile residual stress. Int. J. Solids Struct. 42 (2005) 2771-2784
-
(2005)
Int. J. Solids Struct.
, vol.42
, pp. 2771-2784
-
-
Guo, S.1
Wan, K.-T.2
Dillard, D.A.3
-
15
-
-
62849088819
-
-
Hibbit, Karlsson, Sorensen Inc., 2004. ABAQUS Reference Manuals, version 6.5.
-
Hibbit, Karlsson, Sorensen Inc., 2004. ABAQUS Reference Manuals, version 6.5.
-
-
-
-
16
-
-
0025491012
-
Measuring stiffnesses and residual stresses of silicon nitride thin films
-
Hong S., Weihs T.P., Bravman J.C., and Nix W.D. Measuring stiffnesses and residual stresses of silicon nitride thin films. J. Electron. Mater. 19 (1990) 903-909
-
(1990)
J. Electron. Mater.
, vol.19
, pp. 903-909
-
-
Hong, S.1
Weihs, T.P.2
Bravman, J.C.3
Nix, W.D.4
-
17
-
-
33645816809
-
Effect of Ti interlayer on the residual stress and texture development of TiN thin films
-
Huang J.-H., Ma C.-H., and Chen H. Effect of Ti interlayer on the residual stress and texture development of TiN thin films. Surf. Coat. Technol. 200 (2006) 5937-5945
-
(2006)
Surf. Coat. Technol.
, vol.200
, pp. 5937-5945
-
-
Huang, J.-H.1
Ma, C.-H.2
Chen, H.3
-
18
-
-
71149121504
-
Mixed model cracking in layered materials
-
Hutchinson J.W., and Suo Z. Mixed model cracking in layered materials. Adv. Appl. Mech. 29 (1992) 63-191
-
(1992)
Adv. Appl. Mech.
, vol.29
, pp. 63-191
-
-
Hutchinson, J.W.1
Suo, Z.2
-
19
-
-
0026815322
-
Growth and configurational stability of circular, buckling-driven film delaminations
-
Hutchinson J.W., Thouless M.D., and Liniger E.G. Growth and configurational stability of circular, buckling-driven film delaminations. Acta Metall. Mater. 40 (1992) 295-308
-
(1992)
Acta Metall. Mater.
, vol.40
, pp. 295-308
-
-
Hutchinson, J.W.1
Thouless, M.D.2
Liniger, E.G.3
-
20
-
-
0026404305
-
The blister test for interface toughness measurement
-
Jensen H.M., and Thouless M.D. The blister test for interface toughness measurement. Eng. Fract. Mech. 40 (1991) 475-486
-
(1991)
Eng. Fract. Mech.
, vol.40
, pp. 475-486
-
-
Jensen, H.M.1
Thouless, M.D.2
-
21
-
-
0027233158
-
Effects of residual stresses in the blister test
-
Jensen H.M., and Thouless M.D. Effects of residual stresses in the blister test. Int. J. Solids Struct. 30 (1993) 779-795
-
(1993)
Int. J. Solids Struct.
, vol.30
, pp. 779-795
-
-
Jensen, H.M.1
Thouless, M.D.2
-
24
-
-
33745842977
-
Fracture characterization in patterned thin films by cross-sectional nanoindentation
-
Ocaña I., Molina-Aldareguia J.M., Gonzalez D., et al. Fracture characterization in patterned thin films by cross-sectional nanoindentation. Acta Mater. 54 (2006) 3453-3462
-
(2006)
Acta Mater.
, vol.54
, pp. 3453-3462
-
-
Ocaña, I.1
Molina-Aldareguia, J.M.2
Gonzalez, D.3
-
25
-
-
0023979063
-
Elastic fracture mechanics concepts for interfacial cracks
-
Rice J.R. Elastic fracture mechanics concepts for interfacial cracks. J. Appl. Mech. 110 (1988) 98-103
-
(1988)
J. Appl. Mech.
, vol.110
, pp. 98-103
-
-
Rice, J.R.1
-
26
-
-
25444447431
-
Optimizing the precision of the four-point bend test for the measurement of thin film adhesion
-
Shaviv R., Roham S., and Woytowitz P. Optimizing the precision of the four-point bend test for the measurement of thin film adhesion. Microelectron. Eng. 82 (2005) 99-112
-
(2005)
Microelectron. Eng.
, vol.82
, pp. 99-112
-
-
Shaviv, R.1
Roham, S.2
Woytowitz, P.3
-
27
-
-
0041398583
-
Cross-sectional nanoindentation: a new technique for thin film interfacial adhesion characterization
-
Sánchez J.M., El-Mansy S., Sun B., et al. Cross-sectional nanoindentation: a new technique for thin film interfacial adhesion characterization. Acta Mater. 47 (1999) 4405-4413
-
(1999)
Acta Mater.
, vol.47
, pp. 4405-4413
-
-
Sánchez, J.M.1
El-Mansy, S.2
Sun, B.3
-
29
-
-
0037039675
-
Interfacial toughness measurements for thin films on substrates
-
Volinsky A.A., Moody N.R., and Gerberich W.W. Interfacial toughness measurements for thin films on substrates. Acta Mater. 50 (2002) 441-466
-
(2002)
Acta Mater.
, vol.50
, pp. 441-466
-
-
Volinsky, A.A.1
Moody, N.R.2
Gerberich, W.W.3
-
30
-
-
0036522048
-
Adherence of an axisymmetric flat punch onto a clamped circular plate: transition from a rigid plate to a flexible membrane
-
Wan K.-T. Adherence of an axisymmetric flat punch onto a clamped circular plate: transition from a rigid plate to a flexible membrane. J. Appl. Mech. 69 (2002) 110-116
-
(2002)
J. Appl. Mech.
, vol.69
, pp. 110-116
-
-
Wan, K.-T.1
-
31
-
-
0036522192
-
Adherence of a rectangular flat punch onto a clamped plates: transition from a rigid plate to a flexible membrane
-
Wan K.-T., and Duan J. Adherence of a rectangular flat punch onto a clamped plates: transition from a rigid plate to a flexible membrane. J. Appl. Mech. 69 (2002) 104-109
-
(2002)
J. Appl. Mech.
, vol.69
, pp. 104-109
-
-
Wan, K.-T.1
Duan, J.2
-
32
-
-
20844452777
-
Toughness measurement of thin films: a critical review
-
Zhang S., Sun D., Fu Y.Q., and Du H.J. Toughness measurement of thin films: a critical review. Surf. Coat. Technol. 198 (2005) 74-84
-
(2005)
Surf. Coat. Technol.
, vol.198
, pp. 74-84
-
-
Zhang, S.1
Sun, D.2
Fu, Y.Q.3
Du, H.J.4
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