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Physical Review B - Condensed Matter and Materials Physics

Volumn 79, Issue 7, 2009, Pages

Strain in a single ultrathin silicon layer on top of SiGe islands: Raman spectroscopy and simulations

(10) Bonera, E a Pezzoli, F b Picco, A a Vastola, G a Stoffel, M b Grilli, E a Guzzi, M a Rastelli, A b Schmidt, O G b Miglio, L a

a UNIVERSITY OF MILANO BICOCCA (Italy)

b IFW DRESDEN (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 62549166728 PISSN: 10980121 EISSN: 1550235X Source Type: Journal
DOI: 10.1103/PhysRevB.79.075321 Document Type: Article

Times cited : (26)

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