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Volumn 103, Issue 9, 2008, Pages

Phonon strain shift coefficients in Si1-x Gex alloys

Author keywords

[No Author keywords available]

Indexed keywords

HETEROJUNCTIONS; PHONONS; RAMAN SPECTROSCOPY; X RAY DIFFRACTION ANALYSIS;

EID: 43949146310     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2913052     Document Type: Article
Times cited : (75)

References (25)
  • 1
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    • D. J. Paul, Semicond. Sci. Technol. 0268-1242 10.1088/0268-1242/19/10/R02 19, R75 (2004).
    • (2004) Semicond. Sci. Technol. , vol.19 , pp. 75
    • Paul, D.J.1
  • 6
    • 0000272254 scopus 로고
    • 0163-1829 10.1103/PhysRevB.45.8565.
    • D. J. Lockwood and J. -M. Baribeau, Phys. Rev. B 0163-1829 10.1103/PhysRevB.45.8565 45, 8565 (1992).
    • (1992) Phys. Rev. B , vol.45 , pp. 8565
    • Lockwood, D.J.1    Baribeau, J.-M.2
  • 12
    • 0000873311 scopus 로고
    • 0163-1829 10.1103/PhysRevB.52.11059.
    • H. Rücker and M. Methfessel, Phys. Rev. B 0163-1829 10.1103/PhysRevB.52.11059 52, 11059 (1995).
    • (1995) Phys. Rev. B , vol.52 , pp. 11059
    • Rücker, H.1    Methfessel, M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.