A comprehensive study of temperature-dependent reflectance and photoluminescence of Zn1-x Mnx O thin films grown on c -Al2O 3

Journal of Applied Physics

Volumn 105, Issue 5, 2009, Pages

  Lin, D Y ^a   Lin, H J ^a   Wu, J S ^a   Chou, W C ^b   Yang, C S ^c   Wang, J S ^d  

^a NATIONAL CHANGHUA UNIVERSITY OF EDUCATION   (Taiwan)

^b NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

^c TATUNG UNIVERSITY   (Taiwan)

^d CHUNG YUAN CHRISTIAN UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL GROWTH; MANGANESE; MANGANESE ALLOYS; MANGANESE COMPOUNDS; MOLECULAR BEAMS; MOLECULAR DYNAMICS; PHOTOLUMINESCENCE; REFLECTION; SEMICONDUCTOR QUANTUM DOTS; ZINC COMPOUNDS;

COMPREHENSIVE STUDIES; CRYSTALLINE QUALITIES; EXCITON TRANSITIONS; LONGITUDINAL-OPTICAL; MN ATOMS; PHOTOLUMINESCENCE MEASUREMENTS; PL SPECTRUM; PLASMA-ASSISTED MOLECULAR BEAM EPITAXIES; SPECTRAL DATUM; SYSTEMATIC STUDIES; TEMPERATURE DEPENDENCES; TEMPERATURE DEPENDENTS; TRANSITION ENERGIES;

ACTIVATION ENERGY;

EID: 62549148642     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3078034     Document Type: Article

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