-
1
-
-
62549114762
-
-
Ph.D. Thesis, University of Maryland, College Park, MD.
-
J. Wang, Ph.D. Thesis, University of Maryland, College Park, MD (2005).
-
(2005)
-
-
Wang, J.1
-
2
-
-
24644449094
-
-
S. Y. Yang, F. Zavaliche, L. Mohaddes-Ardabili, V. Vaithyanathan, D. G. Schlom, Y. J. Lee, Y. H. Chu, M. P. Cruz, Q. Zhan, Appl. Phys. Lett., 87, 102903 (2005).
-
(2005)
Appl. Phys. Lett.
, vol.87
, pp. 102903
-
-
Yang, S.Y.1
Zavaliche, F.2
Mohaddes-Ardabili, L.3
Vaithyanathan, V.4
Schlom, D.G.5
Lee, Y.J.6
Chu, Y.H.7
Cruz, M.P.8
Zhan, Q.9
-
3
-
-
0037436499
-
-
J. Wang, J. B. Neaton, H. Zheng, V. Nagarajan, S. B. Ogale, B. Liu, D. Viehland, V. Vaithyanathan, D. G. Schlom, U. V. Waghmare, Science, 299, 1719 (2003).
-
(2003)
Science
, vol.299
, pp. 1719
-
-
Wang, J.1
Neaton, J.B.2
Zheng, H.3
Nagarajan, V.4
Ogale, S.B.5
Liu, B.6
Viehland, D.7
Vaithyanathan, V.8
Schlom, D.G.9
Waghmare, U.V.10
-
4
-
-
18944368523
-
-
W. Eerenstein, F. D. Morrison, J. Dho, M. G. Blamire, J. F. Scott, and N. D. Mathur, Science, 307, 1203a (2005).
-
(2005)
Science
, vol.307
-
-
Eerenstein, W.1
Morrison, F.D.2
Dho, J.3
Blamire, M.G.4
Scott, J.F.5
Mathur, N.D.6
-
5
-
-
32044456246
-
-
R. Ueno, S. Okaura, H. Funakubo, and K. Saito, Jpn. J. Appl. Phys., Part 2, 44, L1231 (2005).
-
(2005)
Jpn. J. Appl. Phys., Part 2
, vol.44
, pp. 1231
-
-
Ueno, R.1
Okaura, S.2
Funakubo, H.3
Saito, K.4
-
6
-
-
34547673603
-
-
M. S. Kartavtseva, O. Y. Gorbenko, A. R. Kaul, A. R. Akbashev, T. V. Murzina, S. Fusil, A. Barth́ĺmy, and F. Pailloux, Surf. Coat. Technol., 201, 9149 (2007).
-
(2007)
Surf. Coat. Technol.
, vol.201
, pp. 9149
-
-
Kartavtseva, M.S.1
Gorbenko, O.Y.2
Kaul, A.R.3
Akbashev, A.R.4
Murzina, T.V.5
Fusil, S.6
Barth́ĺmy, A.7
Pailloux, F.8
-
7
-
-
54949152355
-
-
J. Thery, C. Dubourdieu, T. Baron, C. Ternon, H. Roussel, and F. Pierre, Chem. Vap. Deposition, 13, 232 (2007).
-
(2007)
Chem. Vap. Deposition
, vol.13
, pp. 232
-
-
Thery, J.1
Dubourdieu, C.2
Baron, T.3
Ternon, C.4
Roussel, H.5
Pierre, F.6
-
8
-
-
33745815326
-
-
Y. Tasaki, T. Kanoko, M. Kabeya, N. Chifu, and S. Yoshizawa, Integr. Ferroelectr., 81, 281 (2006).
-
(2006)
Integr. Ferroelectr.
, vol.81
, pp. 281
-
-
Tasaki, Y.1
Kanoko, T.2
Kabeya, M.3
Chifu, N.4
Yoshizawa, S.5
-
9
-
-
34547678603
-
-
A. C. Jones, H. C. Aspinall, and P. R. Chalker, Surf. Coat. Technol., 201, 9046 (2007).
-
(2007)
Surf. Coat. Technol.
, vol.201
, pp. 9046
-
-
Jones, A.C.1
Aspinall, H.C.2
Chalker, P.R.3
-
11
-
-
49149097641
-
-
M. K. Singh, Y. Yang, and C. G. Takoudis, J. Electrochem. Soc., 155, D618 (2008).
-
(2008)
J. Electrochem. Soc.
, vol.155
, pp. 618
-
-
Singh, M.K.1
Yang, Y.2
Takoudis, C.G.3
-
12
-
-
34247496738
-
-
M. S. Kartavtseva, O. Y. Gorbenko, A. R. Kaul, T. V. Murzina, S. A. Savinov, and A. Barth́ĺmy, Thin Solid Films, 515, 6416 (2007).
-
(2007)
Thin Solid Films
, vol.515
, pp. 6416
-
-
Kartavtseva, M.S.1
Gorbenko, O.Y.2
Kaul, A.R.3
Murzina, T.V.4
Savinov, S.A.5
Barth́ĺmy, A.6
-
13
-
-
62549089021
-
-
Materials Data, Inc., Livermore, CA.
-
MDI JADE 8.0, Materials Data, Inc., Livermore, CA (2007).
-
(2007)
MDI JADE 8.0
-
-
-
14
-
-
0542395235
-
-
J. W. Hong, K. H. Noh, S.-I. Park, S. I. Kwun, and Z. G. Khim, Phys. Rev. B, 58, 5078 (1998).
-
(1998)
Phys. Rev. B
, vol.58
, pp. 5078
-
-
Hong, J.W.1
Noh, K.H.2
Park, S.-I.3
Kwun, S.I.4
Khim, Z.G.5
-
15
-
-
0000598015
-
-
J. W. Hong, S.-I. Park, and Z. G. Khim, Rev. Sci. Instrum., 70, 1735 (1999).
-
(1999)
Rev. Sci. Instrum.
, vol.70
, pp. 1735
-
-
Hong, J.W.1
Park, S.-I.2
Khim, Z.G.3
-
16
-
-
44249117368
-
-
H. Naganuma, Y. Inoue, and S. Okarnura, IEEE Trans. Ultrason. Ferroelectr. Freq. Control, 55, 1046 (2008).
-
(2008)
IEEE Trans. Ultrason. Ferroelectr. Freq. Control
, vol.55
, pp. 1046
-
-
Naganuma, H.1
Inoue, Y.2
Okarnura, S.3
-
17
-
-
0003459529
-
-
Perkin-Elmer Corporation, Eden Prairie, MN.
-
J. F. Moulder, W. F. Stickle, P. E. Sobol, and K. D. Bomben, Handbook of X-Ray Photoelectron Spectroscopy, Perkin-Elmer Corporation, Eden Prairie, MN (1992).
-
(1992)
Handbook of X-Ray Photoelectron Spectroscopy
-
-
Moulder, J.F.1
Stickle, W.F.2
Sobol, P.E.3
Bomben, K.D.4
-
20
-
-
33746095788
-
-
H. Bea, M. Bibes, S. Fusil, K. Bouzehouane, E. Jacquet, K. Rode, P. Bencok, and A. Barthelemy, Phys. Rev. B, 74, 020101 (2006).
-
(2006)
Phys. Rev. B
, vol.74
, pp. 020101
-
-
Bea, H.1
Bibes, M.2
Fusil, S.3
Bouzehouane, K.4
Jacquet, E.5
Rode, K.6
Bencok, P.7
Barthelemy, A.8
-
22
-
-
44649199352
-
-
M. K. Singh, R. S. Katiyar, and J. F. Scott, J. Phys. Condens. Matter, 20, 252203 (2008).
-
(2008)
J. Phys. Condens. Matter
, vol.20
, pp. 252203
-
-
Singh, M.K.1
Katiyar, R.S.2
Scott, J.F.3
-
23
-
-
20544451827
-
-
John Wiley & Sons, Hoboken, NJ.
-
L. F. Chen, C. K. Ong, C. P. Neo, V. V. Varadan, and V. K. Varadan, Microwave Electronics: Measurement and Materials Characterization, John Wiley & Sons, Hoboken, NJ (2004).
-
(2004)
Microwave Electronics: Measurement and Materials Characterization
-
-
Chen, L.F.1
Ong, C.K.2
Neo, C.P.3
Varadan, V.V.4
Varadan, V.K.5
-
24
-
-
0344877162
-
-
T. Kimura, T. Goto, H. Shintani, K. Ishizaka, T. Arima, and Y. Tokura, Nature (London), 426, 55 (2003).
-
(2003)
Nature (London)
, vol.426
, pp. 55
-
-
Kimura, T.1
Goto, T.2
Shintani, H.3
Ishizaka, K.4
Arima, T.5
Tokura, Y.6
|