Dependence of ferroelectric and magnetic properties on measuring temperatures for polycrystalline BiFeO3 films

IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control

Volumn 55, Issue 5, 2008, Pages 1046-1050

  Naganuma, Hiroshi ^a   Inoue, Yosuke ^a   Okamura, Soichiro ^a  

^a TOKYO UNIVERSITY OF SCIENCE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BISMUTH COMPOUNDS; FERROELECTRICITY; MAGNETIC PROPERTIES; THERMAL EFFECTS;

CHEMICAL SOLUTION DEPOSITION (CSD; ELECTRIC COERCIVE FIELD; POLYCRYSTALLINE SINGLE PHASE;

POLYCRYSTALLINE MATERIALS;

BISMUTH; BISMUTH OXIDE; FERRIC ION; FERRIC OXIDE;

ARTICLE; ARTIFICIAL MEMBRANE; CHEMISTRY; CRYSTALLIZATION; ELECTRIC CONDUCTIVITY; MAGNETISM; MATERIALS TESTING; METHODOLOGY; TEMPERATURE;

BISMUTH; CRYSTALLIZATION; ELECTRIC CONDUCTIVITY; FERRIC COMPOUNDS; MAGNETICS; MATERIALS TESTING; MEMBRANES, ARTIFICIAL; TEMPERATURE;

EID: 44249117368     PISSN: 08853010     EISSN: None     Source Type: Journal    
DOI: 10.1109/TUFFC.2008.754     Document Type: Conference Paper

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