Test metrics for analog parametric faults

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 1999, Pages 226-234

  Sunter, Stephen ^a   Nagi, Naveena ^a  

^a LogicVision Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; LINEAR INTEGRATED CIRCUITS; NUMERICAL METHODS; OPERATIONAL AMPLIFIERS; PROBABILITY; RELIABILITY; STATISTICAL METHODS;

ANALOG PARAMETRIC FAULTS; PROBABILITY BASED EQUATIONS;

INTEGRATED CIRCUIT TESTING;

EID: 0032661188     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (13)