Microlens performance limits in sub-2 μm pixel CMOS image sensors

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 7250, Issue , 2009, Pages

  Huo, Yijie ^a   Fesenmaier, Christian C ^a   Catrysse, Peter B ^a  

^a Stanford University   (United States)

Author keywords

CMOS image sensor; Finite difference time domain method; Microlens; Optical crosstalk; Optical efficiency; Pixel; Scaling; Sensitivity

Indexed keywords

CMOS IMAGE SENSOR; MICROLENS; OPTICAL CROSSTALK; OPTICAL EFFICIENCY; SCALING; SENSITIVITY;

CROSSTALK; DIFFRACTION; DIGITAL CAMERAS; DIGITAL IMAGE STORAGE; FINITE DIFFERENCE TIME DOMAIN METHOD; IMAGE SENSORS; METHOD OF MOMENTS; MICROLENSES; PHOTOGRAPHY; REFRACTION;

PIXELS;

EID: 62249137808     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.807007     Document Type: Conference Paper

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