Estimating and incorporating the effects of a future QE project into a semiconductor yield learning model with a fuzzy set approach

European Journal of Industrial Engineering

Volumn 3, Issue 2, 2009, Pages 207-226

  Chen, Toly ^a  

^a FENG CHIA UNIVERSITY   (Taiwan)

Author keywords

Correction function; Fuzzy Delphi method; Quality engineering; Semiconductor

Indexed keywords

COMPETITION; FUZZY SETS; MANAGERS; RANDOM ACCESS STORAGE; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR MATERIALS;

CORRECTION FUNCTION; FUZZY DELPHI METHOD; MANAGERIAL ACTIONS; QUALITY ENGINEERING; RANDOM ACCESS MEMORY; SEMICONDUCTOR INDUSTRY; SEMICONDUCTOR MANUFACTURING; YIELD IMPROVEMENT;

LEARNING SYSTEMS;

EID: 62149094017     PISSN: 17515254     EISSN: 17515262     Source Type: Journal    
DOI: 10.1504/EJIE.2009.023612     Document Type: Article

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