Evaluating the mid-term competitiveness of a product in a semiconductor fabrication factory with a systematic procedure

Computers and Industrial Engineering

Volumn 53, Issue 3, 2007, Pages 499-513

  Chen, Toly ^a  

^a FENG CHIA UNIVERSITY   (Taiwan)

Author keywords

Competitiveness; Correction function; Semiconductor; Yield learning

Indexed keywords

COMPETITIVE INTELLIGENCE; CORRELATION METHODS; MATHEMATICAL MODELS; PRODUCT DEVELOPMENT; SYSTEMS ANALYSIS;

CORRECTION FUNCTIONS; FUZZY YIELD LEARNING MODELS; SEMICONDUCTOR FABRICATION FACTORY; SYSTEMATIC PROCEDURE;

SEMICONDUCTOR DEVICE MANUFACTURE;

EID: 34648828638     PISSN: 03608352     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cie.2007.05.008     Document Type: Article

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