SCOPUS 정보 검색 플랫폼

Volumn 28, Issue 5-6, 2006, Pages 610-617

Manufacturing performance evaluation for IC products

Author keywords

Integrated circuit (IC); Manufacturing performance; Yield analysis; Yield model

Indexed keywords

COMPUTATIONAL COMPLEXITY; DEFECTS; MANUFACTURE; MATHEMATICAL MODELS; PERFORMANCE;

MANUFACTURING PERFORMANCE; PRODUCTION LINE; YIELD ANALYSIS; YIELD MODEL;

INTEGRATED CIRCUITS;

EID: 33645530571 PISSN: 02683768 EISSN: 14333015 Source Type: Journal
DOI: 10.1007/s00170-004-2382-2 Document Type: Article

Times cited : (9)

References (12)

1
- 0025433611
- The use and evaluation of yield models in integrated circuit manufacturing
- Cunningham JA (1990) The use and evaluation of yield models in integrated circuit manufacturing. IEEE Trans Semicond Manuf 3:60-71
- (1990) IEEE Trans Semicond Manuf , vol.3 , pp. 60-71
- Cunningham, J.A.¹

2
- 0021782318
- The effects of wafer to wafer density variation on Integrated circuit defect and fault distributions
- Stapper CH (1985) The effects of wafer to wafer density variation on Integrated circuit defect and fault distributions. IBM J Res Dev 29:87-97
- (1985) IBM J Res Dev , vol.29 , pp. 87-97
- Stapper, C.H.¹

3
- 0003643573
- Artech, Norwood
- Ferris-Prahhu AV (1992) Introduction to semiconductor device yield modeling. Artech, Norwood
- (1992) Introduction to Semiconductor Device Yield Modeling
- Ferris-Prahhu, A.V.¹

4
- 84938162176
- Cost-size optima of monolithic integrated circuits
- Murphy BT (1964) Cost-size optima of monolithic integrated circuits. Proceedings of the IEEE 52:1537-1545
- (1964) Proceedings of the IEEE , vol.52 , pp. 1537-1545
- Murphy, B.T.¹

5
- 0031126244
- Raghavachari M, Srinivasan A, Sullo P (1997) Poisson mixture yield models for integrated circuits: a critical review, Microelectron Reliab 37:565-580
- (1997) Poisson Mixture Yield Models for Integrated Circuits: A Critical Review, Microelectron Reliab , vol.37 , pp. 565-580
- Raghavachari, M.¹ Srinivasan, A.² Sullo, P.³

6
- 0026257569
- Optimized redundancy selection based on failure-related yield model for 64Mb DRAM and beyond
- Kikuda S, Miyamoto H (1991) Optimized redundancy selection based on failure-related yield model for 64Mb DRAM and beyond, IEEE J Solid State Circuits 26:1550-1555
- (1991) IEEE J Solid State Circuits , vol.26 , pp. 1550-1555
- Kikuda, S.¹ Miyamoto, H.²

7
- 0022102574
- Modeling the critical area in yield forecasts
- Ferris-Prabhu AV (1985) Modeling the critical area in yield forecasts. IEEE J Solid State Circuits 20:874-878
- (1985) IEEE J Solid State Circuits , vol.20 , pp. 874-878
- Ferris-Prabhu, A.V.¹

8
- 0025430458
- A cluster-modified Poisson model for estimating defect density and yield
- Ferris-Prabhu AV (1990) A cluster-modified Poisson model for estimating defect density and yield. IEEE Trans Semicond Manuf 3:54-59
- (1990) IEEE Trans Semicond Manuf , vol.3 , pp. 54-59
- Ferris-Prabhu, A.V.¹

9
- 0024629198
- Large-area fault clusters and fault tolerance in VSLI circuits
- Stapper CH (1989) Large-area fault clusters and fault tolerance in VSLI circuits. IBM J Res Develop 33(2):162-173
- (1989) IBM J Res Develop , vol.33 , Issue.2 , pp. 162-173
- Stapper, C.H.¹

10
- 0024627901
- Small-area fault clusters and fault tolerance in VSLI circuits
- Stapper CH (1989) Small-area fault clusters and fault tolerance in VSLI circuits. IBM J Res Develop 33(2):174-177
- (1989) IBM J Res Develop , vol.33 , Issue.2 , pp. 174-177
- Stapper, C.H.¹

11
- 0003651874
- Pion, London
- Rogers A (1974) Statistical analysis of spatial dispersion: the quadrat method. Pion, London
- (1974) Statistical Analysis of Spatial Dispersion: The Quadrat Method
- Rogers, A.¹

12
- 0004013653
- Wiley, New York
- Ludwig JA, Reynolds JF (1988) Statistical ecology: a primer on methods and computing. Wiley, New York
- (1988) Statistical Ecology: A Primer on Methods and Computing
- Ludwig, J.A.¹ Reynolds, J.F.²

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.