Interface stress and an apparent negative Poisson's ratio in Ag/Ni multilayers

Materials Research Society Symposium - Proceedings

Volumn 505, Issue , 1998, Pages 559-567

  Schweitz, K O ^a   Geisler, H ^a   Chevallier, J ^a   Bottiger, J ^a   Feidenhans'l, R ^a  

^a AARHUS UNIVERSITY   (Denmark)

Author keywords

[No Author keywords available]

Indexed keywords

COMPRESSIVE STRESS; INTERFACES (MATERIALS); MAGNETRON SPUTTERING; POISSON RATIO; SILVER ALLOYS; STRESS CONCENTRATION; SUBSTRATES; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

INTERFACE STRESS;

MULTILAYERS;

EID: 0031640974     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (22)