Chemical composition of ZrC thin films grown by pulsed laser deposition

Applied Surface Science

Volumn 255, Issue 10, 2009, Pages 5260-5263

  Craciun, D ^a   Socol, G ^a   Stefan, N ^a   Bourne, G ^b   Craciun, V ^a,b  

^a NATIONAL INSTITUTE FOR LASER   (Romania)

^b University of Florida   (United States)

Author keywords

Laser ablation; PLD; Thin films; ZrC

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; CARBIDES; EXCIMER LASERS; LASER ABLATION; PULSED LASER DEPOSITION; PULSED LASERS; SUBSTRATES; TEXTURES; THICKNESS MEASUREMENT; THIN FILMS; X RAY DIFFRACTION; ZIRCONIUM COMPOUNDS;

AS-DEPOSITED FILMS; AUGER ELECTRON SPECTROSCOPIES (AES); CHEMICAL COMPOSITIONS; OXYGEN CONCENTRATIONS; SUBSTRATE TEMPERATURE; SURFACE ELEMENTAL COMPOSITIONS; X RAY REFLECTIVITY; X-RAY DIFFRACTION INVESTIGATIONS;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 61349107293     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2008.08.097     Document Type: Article

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