Mechanical properties of ZrC thin films grown by pulsed laser deposition

Journal of Optoelectronics and Advanced Materials

Volumn 8, Issue 1, 2006, Pages 20-23

  Woo, A J ^a   Bourne, G ^a   Craciun, V ^a   Craciun, D ^b   Singh, R K ^a  

^a University of Florida   (United States)

^b NATIONAL INSTITUTE FOR LASER   (Romania)

Author keywords

Epitaxial films; Hardness; Laser ablation; Nanoindentation; ZrC

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; CRYSTALLINITY; EPITAXIAL FILMS; HARDNESS; LASER ABLATION; NANOINDENTATION; PULSED LASER DEPOSITION; PULSED LASERS; SAPPHIRE; SILICON; SUBSTRATES; X RAY DIFFRACTION;

CRYSTALLINE QUALITY; DEGREE OF CRYSTALLINITY; IN-PLANE ORIENTATION; NANO-INDENTATION MEASUREMENTS; OUT-OF PLANE; PULSED-LASER DEPOSITION TECHNIQUE; SAPPHIRE SUBSTRATES; X RAY REFLECTIVITY;

ZIRCONIUM COMPOUNDS;

EID: 33645988242     PISSN: 14544164     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Conference Paper

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