Investigation of the effect of cerium doping on the electrical properties and leakage current behavior of lead zirconate thin films derived by the sol-gel method

Journal of the American Ceramic Society

Volumn 92, Issue 2, 2009, Pages 396-404

  Alkoy, Ebru Mensur ^a,b   Shiosaki, Tadashi ^b  

^a SABANCI UNIVERSITY   (Turkey)

^b NARA INSTITUTE OF SCIENCE AND TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CERIUM; CERIUM COMPOUNDS; DOPING (ADDITIVES); ELECTRIC PROPERTIES; GELATION; GELS; LEAKAGE CURRENTS; OXIDE MINERALS; PEROVSKITE; SOL-GELS; SOLS; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

ANTIFERROELECTRIC THIN FILMS; CE-DOPING; CERIUM DOPING; CURRENT BEHAVIORS; DIELECTRIC CONSTANTS; DONOR DOPING; ELECTRICAL PROPERTIES; LEAD ZIRCONATE; LEAKAGE CURRENT DENSITIES; ORDER OF MAGNITUDES; OXIDATION STATE; PEROVSKITE PHASE; POOLE-FRENKEL; PSEUDOCUBIC; SOL-GEL METHODS; SPACE CHARGE LIMITED CURRENTS; SPECTROSCOPIC INVESTIGATIONS; SWITCHING FIELDS; UNIFORM MICROSTRUCTURES; X-RAY PHOTOELECTRONS;

SOL-GEL PROCESS;

EID: 60849118085     PISSN: 00027820     EISSN: 15512916     Source Type: Journal    
DOI: 10.1111/j.1551-2916.2008.02858.x     Document Type: Article

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