Microstructure and crystallographic orientation dependence of electrical properties in lead zirconate thin films prepared by sol-gel process

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 44, Issue 12, 2005, Pages 8606-8612

  Mensur Alkoy, Ebru ^a   Alkoy, Sedat ^a,b   Shiosaki, Tadashi ^a  

^a NARA INSTITUTE OF SCIENCE AND TECHNOLOGY   (Japan)

^b GEBZE TECHNICAL UNIVERSITY   (Turkey)

Author keywords

Antiferroelectrics; Lead zirconate; Orientation; Sol gel; Thin films

Indexed keywords

CRYSTAL ORIENTATION; CRYSTALLOGRAPHY; HYSTERESIS; METALLIC FILMS; MICROSTRUCTURE; NANOSTRUCTURED MATERIALS; PEROVSKITE; PYROLYSIS; SOL-GELS; STOICHIOMETRY;

DRYING TEMPERATURE; ELECTRICAL PROPERTIES; LEAD ZIRCONATE; MICRON SIZE GRAINS; ORIENTATION;

LEAD COMPOUNDS;

EID: 31544438827     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.44.8606     Document Type: Article

References (19)

1. B. Xu, L. E. Cross and J. J. Bernstein; Thin Solid Films 377-378 (2000) 712.
2. J. Zhai, Y. Yao, X. Li, T. F. Hung, Z. K. Xu, H. Chen, E. V. Colla and T. B. Wu: J. Appl. Phys. 92 (2002) 3990.
3. T. Tani, J. F. Li, D. Viehland and D. A. Payne: J. Appl. Phys. 75 (1994) 3017.
4. H. Maiwa and N. Ichinose: Jpn. J. Appl. Phys. 40 (2001) 5507.
5. S. S. Sengupta, B. Roberts, J. F. Li, M. C. Kim and D. A. Payne: J. Appl. Phys. 78(1995) 1171.
6. J. H. Jang and K. H. Yoon: Jpn. J. Appl. Phys. 37 (1998) 5162.
7. F. Jona, O. Shirane, F. Mazzi and R. Pepinsky: Phys. Rev. 105 (1957) 849.
8. E. Sawaguchi, H. Maniwa and S. Hoshino: Phys. Rev. 83 (1951) 1078.
9. G. Shirane and S. Hoshino: Acta Crystallogr. 7 (1954) 203.
10. J. H. Jang and K. H. Yoon: Appl. Phys. Lett. 75 (1999) 130.
11. J. H. Jang and K. H. Yoon: Thin Solid Films 401 (2001) 67.
12. E. Mensur Alkoy, S. Alkoy and T. Shiosaki: Jpn. J. Appl. Phys. 44 (2005) 6654.
13. X. G. Tang, J. Wang, X.-X. Wang and H. L.-W. Chan: Solid State Commun. 130 (2004) 373.
14. Z. Huang, Q. Zhang and R. W. Whatmore: J. Mater. Sci. Lett. 17 (1998) 1157.
15. Z. Huang, Q. Zhang and R. W. Whatmore: J. Appl. Phys. 85 (1999) 7355.
16. Z. Huang, Q. Zhang and R. W. Whatmore: J. Appl. Phys. 86 (1999) 1662.
17. L. Pintilie, I. Boerasu, M. J. M. Gomes and M. Pereira: Thin Solid Films 458 (2004) 114.
18. Z. J. Wang, R. Maeda and K. Kikuchi: Jpn. J. Appl. Phys. 38 (1999) 5342.
19. M. Es-Souni and A. Piorra: Mater. Res. Bull. 36 (2001) 2563.